Method for rapidly identifying low-temperature-resistant eggplant germplasm

A low temperature resistant, eggplant technology, applied in horticultural methods, seed and rhizome treatment, botanical equipment and methods, etc., can solve the problems of missed life cycle time, long time consumption, and unfavorable development of eggplant breeding work, and achieve identification efficiency. High, time-consuming effect

Inactive Publication Date: 2020-06-19
SHANGHAI ACAD OF AGRI SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented technology allows us to quickly identify plants from their genetic material by measuring how well they resist cold temperatures during growth or harvesting processes. By comparing this data against previous experiments conducted over several years ago, we can determine which plant species have better ability to grow even when exposed to very small amounts of water below freezing point (F).

Problems solved by technology

The technical problem addressed by this patented technology relates to identifying high-strength Low Temperatures Resistance (LTR) genetic material from eggs that are resistant to these conditions before they start growing out again at an earlier stage due to their vulnerability towards cold temperatures compared to other types of plants grown on open fields where there may be no greenhouse effect. This makes developing new specific LTM genes difficult because previous methods were limited in terms of speed and accuracy.

Method used

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0025] The present invention provides the following technical solutions: a method for rapid identification of low-temperature-resistant eggplant germplasm, comprising the following steps:

[0026] Step 1. Treat different types of eggplant seeds and germinated seedlings at a low temperature of 10°C;

[0027] Step 2, measure the seed germination rate of eggplant seed germination stage, germination potential, germination index, vigor index and chilling injury index under low temperature of eggplant seedlings, seedling recovery ability;

[0028] Step 3: Judgment of low-temperature-resistant eggplant germplasm: The eggplant germplasm with seed germination rate, seed germination potential, seed germination index, and seed vigor index > 0, and seedling chilling injury index 0 is low-temperature-resistant eggplant Germplasm.

[0029] Concretely, the assay method in the described step 2 is:

[0030] Germination rate = total number of germinated seeds / total number of tested seeds × 1...

Embodiment 2

[0042] The present invention provides the following technical solutions: a method for rapid identification of low-temperature-resistant eggplant germplasm, comprising the following steps:

[0043] Step 1. Treat different types of eggplant seeds and germinated seedlings at a low temperature of 20°C;

[0044] Step 2, measure the seed germination rate of eggplant seed germination stage, germination potential, germination index, vigor index and chilling injury index under low temperature of eggplant seedlings, seedling recovery ability;

[0045] Step 3: Judgment of low-temperature-resistant eggplant germplasm: The eggplant germplasm with seed germination rate, seed germination potential, seed germination index, and seed vigor index > 0, and seedling chilling injury index 0 is low-temperature-resistant eggplant Germplasm.

[0046] Concretely, the assay method in the described step 2 is:

[0047] Germination rate = total number of germinated seeds / total number of tested seeds × 1...

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Abstract

The invention belongs to the technical field of eggplant cultivation and breeding and particularly relates to a method for rapidly identifying low-temperature-resistant eggplant germplasm. The methodcomprises steps as follows: S1, different types of eggplant seeds and germinated seedlings are treated at the low temperature of 10-20 DEG C; S2, the seed germination rate, the germination potential,the germination index and the vital index of the eggplant seeds at the germination stage and the cold damage index and the recovery capacity of eggplant seedlings at the seedling stage are determined.The method for rapidly identifying the low-temperature-resistant eggplant germplasm is established, the seed germination potential, the germination rate and the germination index under the low-temperature condition are determined, the eggplant germplasm which has higher germination rate, germination potential, germination index and vital index at each temperature gradient, can still germinate even under the low-temperature condition of 10 DEG C and grow the seedlings with higher activity and recovery capacity is obtained, and the germplasm can serve as a good material for low-temperature-resistant breeding of eggplants in the future.

Description

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Claims

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Application Information

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Owner SHANGHAI ACAD OF AGRI SCI
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