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System testing method and device

A technology of system testing and the system under test, which is applied in the field of financial technology, can solve problems such as low system testing efficiency and untimely system fault location, and achieve the effects of reliable performance analysis results, fast positioning, and improved efficiency

Pending Publication Date: 2020-05-08
WEBANK (CHINA)
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Problems solved by technology

[0004] Embodiments of the present invention provide a system testing method and device to solve the problems of low test efficiency and untimely system fault location in existing systems

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Embodiment Construction

[0044]In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0045] figure 1 It exemplarily shows a system architecture applicable to a system testing method provided by an embodiment of the present invention. The system architecture may include a testing device 101 and a device under test 102. When the device under test 102 has undergone a system update or software and hardware improvement etc., all require the test device 101 to perform a system test on the device 102 to be tested. Specifically...

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Abstract

The embodiment of the invention provides a system testing method and device. The method comprises the steps that a performance testing device conducts performance testing on at least one server wherea tested system is located, in the performance testing process, operation parameters of the at least one server are obtained, then a target server is determined from the at least one server accordingto the operation parameters, and stack collection is conducted on the tested system on the target server; performance problem analysis is made according to the stack acquisition result, and finally aperformance test result and a performance problem analysis result of the tested system are generated. The method is used for solving the problems of low test efficiency and untimely system fault positioning of an existing system.

Description

technical field [0001] Embodiments of the present invention relate to the field of financial technology (Fintech), and in particular to a system testing method and device. Background technique [0002] With the development of computer technology, more and more technologies are applied in the financial field. The traditional financial industry is gradually transforming into financial technology, and performance testing technology is no exception. The requirements are getting higher and higher, and higher requirements are put forward for the performance testing technology of the system. At present, after the performance test results of the system are obtained, the third-party analysis device is mainly used to re-analyze the performance problems of the system, so there are problems of low test efficiency and untimely system fault location. [0003] Therefore, there is an urgent need for a system testing method and device that can overcome the above problems. Contents of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/26
CPCG06F11/26
Inventor 安继贤李晶晋晓峰盛勤
Owner WEBANK (CHINA)
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