Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and device for improving micro-deformation loading precision

A loading device and micro-deformation technology, which is used in measuring devices, using repetitive force/pulse force to test the strength and strength characteristics of materials, etc. problem, to achieve uniform deformation loading in the whole field, high repeated loading accuracy, and small elastic after-effect lag.

Active Publication Date: 2020-04-10
SHANGHAI JIAO TONG UNIV
View PDF17 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Aiming at the shortcomings of the existing micro-deformation loading uncertainty, the present invention proposes a method and device for improving the micro-deformation loading accuracy, reducing the deformation hysteresis caused by the internal stress of the elastic deformation area of ​​the test piece and reducing the driving device and the test device. The method and device for the displacement error caused by the connection contact force deformation or the connection gap between parts can greatly reduce the uncertainty of the micro-deformation loading device, making it applicable to the field of deformation measurement and calibration requiring high precision

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for improving micro-deformation loading precision
  • Method and device for improving micro-deformation loading precision
  • Method and device for improving micro-deformation loading precision

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] Such as figure 1 As shown, this embodiment relates to a device for improving the accuracy of micro-deformation loading, including: a test piece assembly composed of a fastening screw test piece 1, a thin-walled disc part test piece 2, a fastening screw sleeve test piece 3, and a coupling And the piezoelectric actuator 10, wherein: the test piece assembly and the driving end of the piezoelectric actuator 10 are connected by a rigid coupling, the test piece assembly is fixedly arranged on the base, and the piezoelectric actuator 10 is fixedly arranged on the actuator On the base 11 of the test piece, when the piezoelectric actuator 10 produces a specified displacement and drives the rigid coupling to drive the central area of ​​the test piece assembly to produce a same displacement.

[0025] Between the fastening screw test piece 1 and the thin-walled disc part test piece 2 and between the thin-walled disc part test piece 2 and the fastening screw sleeve test piece 3, all...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for improving the precision of a micro-deformation loading device. A test piece made of a constant-elasticity alloy material is divided into a central displacement area, a middle ring elastic deformation area and a peripheral fastening area, the test piece is designed and assembled in a split manner to form a test piece assembly so as to eliminate the influence ofthe deformation caused by machining of a disc-shaped thin-wall area of the test piece and the deformation of a cutting residual stress deformation area generated in the machining process, and displacement errors caused by threaded connection gaps or contact force deformation at the joint of a high-precision driving device and the test piece are reduced through the connection mode of an outer circle at the output interface of a radial enclasping driving device and an outer circle of the cylindrical extending end of the test piece. According to the method and the device, the deformation hysteresis caused by internal stress after the elastic deformation area of the test piece is deformed is reduced, and the displacement errors caused by connection contact force deformation or connection clearance between the driving device and the test piece is reduced, so that the uncertainty of the micro-deformation loading device can be greatly reduced.

Description

technical field [0001] The invention relates to a technology in the field of deformation measurement, in particular to a method and a device for improving the accuracy of micro-deformation loading. Background technique [0002] The current deformation measurement technology mainly traces the source through the wavelength, and theoretically analyzes the influencing factors of the environment, so as to evaluate the uncertainty of the measurement system. Obviously, this method lacks experimental verification and calibration. The existing high-precision micro-deformation loading device is realized by micro-deformation loading, and micro-deformation loading is applied to the deformation process of the object, which involves two processes of micro-deformation transmission and object deformation. The precision requirement from nm to tens of nm, the transfer process of micro-deformation is easily affected by the micro-gap of the connection (such as thread gap), which makes the trans...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N3/32G01N3/04G01B21/32G01N1/28G01N1/44
CPCG01B21/32G01N1/286G01N1/44G01N3/04G01N3/32G01N2001/2873
Inventor 蔡萍刘持越隆军
Owner SHANGHAI JIAO TONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com