The Method of Measuring the Refractive Index of Materials by Irradiating the Edge and Bottom of a Double Prism
A double prism, refractive index technology, applied in the measurement of phase influence characteristics, teaching models, instruments, etc., can solve the problems of inability to perform measurement, complicated adjustment of spectrometer and Abbe refractive index, and achieve easy-to-understand measurement methods and simple calculations. , the measurement principle is clear
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0020] A method for measuring the refractive index of a material by illuminating the edges and bottom of a double prism, including two lasers 1 and a double prism 2, the double prism 2 includes two isosceles triangular faces and three rectangular faces, the largest rectangular face is the bottom face 3, in addition The two faces are facets 4, the side where the two facets 4 intersect is edge 8, and the isosceles triangle face is called side face 9 (the two isosceles triangle faces are parallel to each other and perpendicular to the three rectangular faces), the isosceles triangle The included angles between the two waists and the base are both α, that is, the included angle between the facet 4 and the bottom 3 is α; α is 0.5-1 o, so the sine value, tangent value and the radian value of the angle are approximately equal, the length of the double prism 2 is 40-60mm, and its thickness is 0.3-1mm, the length of the optical bench is generally more than 1000mm, so the thickness of th...
PUM
Property | Measurement | Unit |
---|---|---|
refractive index | aaaaa | aaaaa |
length | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com