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Device for detecting size of rectangular chip capacitor

A technology for chip capacitance and size detection, applied in electromagnetic measurement devices, electrical/magnetic thickness measurement, measurement devices, etc., can solve the problems of low detection efficiency, reduce the number of measurements, improve the detection efficiency, and shorten the size detection time. Effect

Inactive Publication Date: 2020-02-18
XINCHANG CIZHANG ELECTRONICS TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Technical problem: The current size inspection equipment detects the length, width, and height sequentially through the measurement mechanism, the detection efficiency is low, and the size measurement needs the assistance of the turning mechanism

Method used

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  • Device for detecting size of rectangular chip capacitor
  • Device for detecting size of rectangular chip capacitor
  • Device for detecting size of rectangular chip capacitor

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Embodiment Construction

[0018] Combine below Figure 1 to Figure 6 The present invention is described in detail, and for convenience of description, the orientations mentioned below are now stipulated as follows: figure 1 The up, down, left, right, front and back directions of the projection relationship itself are the same.

[0019] The present invention relates to a cuboid-shaped patch capacitor size detection device, which is mainly used for capacitance size detection. The present invention will be further described below in conjunction with the accompanying drawings of the present invention:

[0020] A cuboid-shaped patch capacitor size detection device according to the present invention includes a transmission box 11, and a transmission cavity 12 with an upward opening is arranged in the transmission box 11, and a transmission device 101 is arranged in the transmission cavity 12. The upper end surface of the rear side of the transmission cavity 12 is fixedly connected with a fixed plate 17, and...

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Abstract

The present invention discloses a device for detecting a size of a rectangular chip capacitor, which includes a transmission box. An upwardly opened transmission cavity is provided in the transmissionbox; a transmission device is provided in the transmission cavity; a fixed plate is fixedly connected with the upper end face of the rear side of the transmission cavity; a lifting device is arrangedon the front end face of the fixed plate; the lifting device is used for lifting movement required for the capacitor size measurement; the lower side of the lifting device is provided with a measuring device for measuring the capacitor size; and the front end face of the fixed plate is provided with a removing device located on the lower side of the measuring device. When the lifting device of the invention drives the size measuring device to move down, the height of the capacitor can be detected. When the size measuring device moves down to a lower limit position, the length and width of thecapacitor can be detected at the same time. Therefore, the invention can improve the efficiency of detecting the size of single capacitor by reducing the measurement times of single capacitor; thereby the overall detection efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of capacitor size detection, in particular to a rectangular parallelepiped chip capacitor size detection device. Background technique [0002] Chip capacitors are a kind of capacitor material. The full name of chip capacitors is: multilayer (laminated, laminated) chip ceramic capacitors, also known as chip capacitors. The shape of chip capacitors can be roughly divided into two categories, one Cylindrical capacitors, one type is cuboid capacitors, chip capacitors usually refer to cuboid chip capacitors, chip capacitor testing is usually divided into: functional inspection, size inspection, appearance inspection, length and width of chip capacitors , height must meet the dimensional tolerance of its design, otherwise there will be defects such as offset during SMT placement, so it is necessary to perform size inspection on the chip capacitor. The current size inspection equipment uses the measurement mechanis...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B7/06G01B7/02B25H1/10B25H1/02B66F7/16B66F7/28
CPCB25H1/02B25H1/10B66F7/16B66F7/28G01B7/02G01B7/082
Inventor 李冬岚
Owner XINCHANG CIZHANG ELECTRONICS TECH CO LTD
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