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Experimental device for shortening flicker decay time of LYSO crystal, and experimental method thereof

An experimental device and decay time technology, applied in measurement devices, scintillation elements, radiation measurement, etc., can solve the problems of shortening the scintillation decay time, multi-pulse signals cannot be displayed correctly, and the scintillation decay time is long, so as to make up for the lack of heating. Uniformity problem, effect of shortening flicker decay time

Pending Publication Date: 2020-01-03
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem that the flicker decay time of the existing LYSO crystal is long and the multi-pulse signal cannot be displayed correctly when performing high-repetition frequency experiments, and provides an experimental device for shortening the scintillation decay time of the LYSO crystal. The crystal is heated to shorten its scintillation decay time

Method used

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  • Experimental device for shortening flicker decay time of LYSO crystal, and experimental method thereof
  • Experimental device for shortening flicker decay time of LYSO crystal, and experimental method thereof

Examples

Experimental program
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Embodiment 1

[0033] Such as figure 1 and figure 2 As shown, an experimental device for shortening the scintillation attenuation time of LYSO crystals includes a vertically arranged thermal insulation sleeve, wherein the thermal insulation sleeve includes a vertically arranged sample placement cylinder 1, and the inner area of ​​the sample placement cylinder 1 is a heating chamber. The sample placement cylinder 1 is made of thermally conductive insulating material, and the thermally conductive insulating material used in the sample placement cylinder 1 in this embodiment is SiC or Si 3 N 4 ceramics. A crystal fixing mechanism is provided in the middle of the inner surface of the sample placement cylinder 1 , and heating wires are uniformly arranged on the outer surface of the sample placement cylinder 1 to form a heating layer 3 . In this embodiment, the sample placement cylinder 1 includes a first cylinder body 11 arranged vertically and a second cylinder body 12 arranged in the first ...

Embodiment 2

[0036] The difference between this embodiment and embodiment 1 is that a metal heat conduction layer 2 is also provided between the heating layer 3 and the sample placement cylinder 1 of this embodiment, the heating wire is made of iron-chromium-aluminum alloy, and the iron-chromium-aluminum resistance wire A layer of oxide layer is set on the outside, which can play a certain role in insulation. The metal heat-conducting layer 2 of this embodiment includes a heat-conducting layer, a heat-conducting insulating layer, and a heat-homogenizing layer arranged sequentially from the outside to the inside, wherein, the heat-conducting layer and the heat-homogenizing layer both adopt a 2mm thick copper layer, and the heat-conducting and insulating layer adopts SiC or Si 3 N 4 Made of ceramics, the heat transfer can be made uniform by setting the metal heat conduction layer 2. The inner and outer sides of the heating wire in this embodiment are wrapped with insulating ceramic sheets....

Embodiment 3

[0038] The difference between this embodiment and Embodiment 2 is that a temperature sensor 5 for detecting the temperature of the heating wire is provided between the heating layer 3 and the metal heat conducting layer 2 in this embodiment. In order to control the temperature of the heating chamber more accurately, a temperature sensor 5 is set between the heating layer 3 and the metal heat-conducting layer 2. In this embodiment, the number of temperature sensors 5 is more than two. The circumferential direction of the heat conducting layer 2 is evenly distributed. When this embodiment is applied, the temperature sensor 5 is used in conjunction with the temperature monitoring system commonly used in the prior art, and the temperature of the heating wire is monitored by the temperature monitoring system. During the test, the heating can be performed according to the signals fed back by multiple temperature sensors 5. Whether the temperature field of the cavity is uniform or no...

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Abstract

The invention discloses an experimental device for shortening flicker decay time of a LYSO crystal, and the experimental device comprises a vertically arranged thermal insulation sleeve, wherein the thermal insulation sleeve comprises a vertically arranged sample placing cylinder, the inner area of the sample placing cylinder is a heating cavity, the sample placing cylinder is made of a thermallyconductive insulating material, a crystal fixing mechanism is provided in the middle of the inner surface of the sample placing cylinder, and heating wires are evenly arranged on the outer surface ofthe sample placing cylinder to form a heating layer. The invention also discloses an experimental method of the above experimental device. The invention detects the flicker decay time of the heated sample crystal by setting a photodetector directly above the sample placing cylinder, and finds that the flicker decay time has changed from the original 36-42ns to 8-12ns, thereby overcoming the technical bias that the persons skilled in the art believe that LYSO crystal flicker cannot be used for high-repetition experiments.

Description

technical field [0001] The invention relates to a repetition frequency test device for scintillation crystals, in particular to an experimental device and an experimental method for shortening the scintillation decay time of LYSO crystals. Background technique [0002] The development of inorganic scintillators with ultra-fast scintillation decay and high light yield has always been an important research direction and hot spot of scintillation materials. After years of development, scientists from various countries have successfully developed many inorganic scintillators with short afterglow, that is, short scintillation decay time. Its decay time is much better than traditional scintillation crystals such as BGO and NaI(Tl). [0003] ZnO and CuI crystals are the two fastest known scintillation crystals at present, and their scintillation decay time is very short, which can reach the sub-ns level, and can meet the time requirements of X-rays or high-energy electrons with a r...

Claims

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Application Information

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IPC IPC(8): G01T7/00G01T1/00
CPCG01T7/00G01T1/003
Inventor 张小丁江孝国丁栋舟侯伟李一丁龙全红魏涛杨国君
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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