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A three-dimensional measurement method of multi-frequency structured light

A technology of three-dimensional measurement and measurement method, applied in the field of optical detection, can solve the problems of single projection measurement device being easily affected by light and shadow, increasing hardware cost and time consumption, low measurement accuracy, etc., so as to eliminate shadow effect and improve sine Accuracy and the effect of improving projection efficiency

Active Publication Date: 2021-05-11
FOSHAN NANHAI GUANGDONG TECH UNIV CNC EQUIP COOP INNOVATION INST +1
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Problems solved by technology

The existing dual-frequency heterodyne phase solution method is limited by the frequency of the fringe grating, and the measurement accuracy is not high. The single-projection measurement device is easily affected by light and shadow, and the multi-eye measurement will greatly increase the hardware cost and time consumption.

Method used

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  • A three-dimensional measurement method of multi-frequency structured light
  • A three-dimensional measurement method of multi-frequency structured light
  • A three-dimensional measurement method of multi-frequency structured light

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Embodiment 1

[0061] Such as figure 1 and figure 2 As shown, this embodiment discloses a multi-frequency structured light three-dimensional measurement device, the three-dimensional measurement device mainly includes a loading platform, a support rod, a fastening bracket, an X-axis slide rail, a Y-axis slide rail, a grating projector, a camera , and a collection device for collecting images of the measured object. The loading platform is fixedly arranged. One end of the support rod is installed on the loading platform, and the other end extends vertically upwards and is connected with the fastening bracket. The fastening bracket is arranged on the support rod, is slidably connected with the support rod and can be locked on the support rod. The X-axis slide rail is fixed on the fastening bracket and arranged vertically on the fastening bracket. The camera is installed downwards on the X-axis slide rail, and is electrically connected to the grating projector and the acquisition device re...

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Abstract

The invention discloses a three-dimensional measurement method of multi-frequency structured light. The three-dimensional measurement equipment mainly includes a loading platform, a support rod, a fastening bracket, an X-axis slide rail, a Y-axis slide rail, a grating projector, a camera, and a Acquisition device for capturing images of the measured object. The measurement method mainly includes step S11: mechanical position calibration of the imaging system; step S12: equipment calibration step; step S13: calculation of internal and external parameters of the camera and grating projector; step S21: triggering the camera and collecting images; step S22: phase unwrapping; S23: Alignment of the left and right projection data; Step S24: Perform 3D reconstruction according to the point cloud. The invention adopts a high frame rate DLP projector, which can effectively improve the sinusoidal precision of the projected grating, and at the same time improve the projection efficiency of the grating. On the other hand, it uses a four-step phase shift and five-frequency iterative algorithm to calculate the three-dimensional coordinates of the object, which can improve the accuracy to 0.005 mm.

Description

technical field [0001] The invention relates to the technical field of optical detection, in particular to a multi-frequency structured light three-dimensional measuring device and a measuring method. Background technique [0002] Three-dimensional shape measurement is widely used in fields such as industry, agriculture, biomedicine, cultural relics protection, and reverse engineering. The structured light measurement technology in active measurement has been paid more and more attention due to its inherent non-contact, high precision, fast speed, and easy implementation. Among them, the method of phase unwrapping is a hot and difficult point of research by Chinese and foreign researchers. . The existing dual-frequency heterodyne phase solution method is limited by the frequency of the fringe grating, and the measurement accuracy is not high. The single-projection measurement device is easily affected by light and shadow, and the multi-eye measurement will greatly increase ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 王华龙李凡毛骁
Owner FOSHAN NANHAI GUANGDONG TECH UNIV CNC EQUIP COOP INNOVATION INST
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