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Method for calculating scattering statistical moment of two-dimensional random rough surface

A calculation method and rough surface technology, applied in calculation, complex mathematical operations, instruments, etc., can solve problems such as difficult calculation of high-order moment statistical characteristics

Active Publication Date: 2019-11-22
XIAN UNIV OF TECH
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Problems solved by technology

[0004] The purpose of the present invention is to provide a method for calculating the statistical moments of scattering of two-dimensional random rough surfaces, which solves the problem of difficult calculation of the statistical characteristics of high-order moments in the prior art

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  • Method for calculating scattering statistical moment of two-dimensional random rough surface
  • Method for calculating scattering statistical moment of two-dimensional random rough surface
  • Method for calculating scattering statistical moment of two-dimensional random rough surface

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Embodiment Construction

[0104] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0105] The present invention is a calculation method of statistical moment of scattering of two-dimensional random rough surface, such as figure 1 As shown, the specific steps are as follows:

[0106] Step 1, solving two types of dual-frequency cross-correlation functions of the scattering field, the specific steps are as follows:

[0107] Step 1.1, solving the first-type dual-frequency cross-correlation function of the scattered field;

[0108] Suppose a coherent plane wave with wavelength λ is irradiated on the two-dimensional Gaussian rough surface ξ(x,y), and the incident direction is (θ i ,0), the scattering direction is The time factor and shadowing effects of the incident field are ignored. A two-dimensional Cartesian coordinate system is established for a random rough surface, and the rough surface is described by a ...

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Abstract

The invention discloses a method for calculating a scattering statistical moment of a two-dimensional random rough surface. The method specifically comprises the following steps: utilizing a Beckmanntheory and a Gaussian moment theorem; through strict theoretical derivation, giving a calculation formula of a second moment of a scattering field, coherent and incoherent scattering intensity and a fourth moment of the scattering field. Therefore, the scattering field high-order moment can be degraded to the low-order moment. The correctness of the scattering field four-order moment function is verified. The laser intensity detection quality can be analyzed through the random rough surface scattering four-order moment function. The method can be widely applied to research of rough surface speckle detection problems in national defense and civil fields.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic scattering on rough surfaces, and in particular relates to a calculation method for statistical moments of scattering on two-dimensional random rough surfaces. Background technique [0002] In recent years, the study of electromagnetic scattering on rough surfaces is of great significance in theoretical analysis and practical application. It is widely used in many fields such as radio wave propagation, communication, airborne radar and spaceborne radar, and promotes the in-depth development of electromagnetic scattering research on random rough surfaces. . Including in the process of detecting ground and air targets, it is usually very convenient to use the second-order statistical characteristics of the signal to express the effect of random media on radio wave propagation. [0003] Scholars at home and abroad have done a lot of research on the dual-frequency cross-correlation function o...

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Application Information

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IPC IPC(8): G06F17/15G06F17/17
CPCG06F17/15G06F17/175
Inventor 王明军思黛蓉陈新欣魏亚飞
Owner XIAN UNIV OF TECH
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