Method and device for automatically identifying position of test patterns in chart picture
A test pattern and automatic recognition technology, applied in the optical field, can solve the problems of low work efficiency and cumbersome process of manually obtaining the position of the test pattern, so as to avoid the difference error and reduce the position of the test pattern.
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[0061] In order to fully understand the technical content of the present invention, the technical solutions of the present invention will be further introduced and illustrated below in conjunction with specific examples, but not limited thereto.
[0062] It should be understood that in this document, relational terms such as first and second etc. are only used to distinguish one entity / operation / object from another entity / operation / object and do not necessarily require or imply that these entities / operations / objects There is no such actual relationship or order between operations / objects.
[0063]It should also be understood that the term "comprises," "comprises," or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or system that includes a set of elements includes not only those elements, but also includes the elements not expressly included. other elements listed, or also include elements inherent in such a proc...
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