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Demura data application method with unified format

A technology of application method and format, applied in the direction of instruments, static indicators, etc., to achieve the effect of reducing the difficulty of development and management and control

Inactive Publication Date: 2019-09-17
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, when the control board and the panel are shipped together, the difficulty of the current solution is acceptable

Method used

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  • Demura data application method with unified format
  • Demura data application method with unified format
  • Demura data application method with unified format

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Embodiment Construction

[0081] A kind of unified format demura data application method provided by the present invention mainly comprises:

[0082] Step S11, system chip initialization;

[0083] Step S12, judging whether there is demura data in the first format in the first memory, if yes, execute step S13, if not, execute step S16;

[0084] Step S13, verify the consistency of the demura data in the first format in the first memory and the demura data in the second format in the second memory, if the verification result is consistent, then execute step S14, if the verification result is inconsistent, then execute step S16;

[0085] Step S14, reading the demura data in the first format in the first memory;

[0086] Step S15, start demura data compensation;

[0087] Step S16, generating demura data in the first format according to the demura data in the second format in the second memory and writing it into the first memory, and then performing step S15.

[0088] Wherein, step S13 may include:

[...

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Abstract

The invention relates to a demura data application method with a unified format. The method comprises the following steps: S11, initializing a system chip; S12, judging whether first format decura data exists in the first memory or not, if yes, executing the step S13, and if not, executing the step S16; S13, verifying the consistency of the first format decura data in the first memory and the second format decura data in the second memory, if the verification result is consistent, executing the step S14, and if the verification result is inconsistent, executing the step S16; s14, reading the first format decura data in the first memory; s15, starting demura data compensation; and S16, generating first format decura data according to the second format decura data in the second memory, writing the first format decura data into the first memory, and then executing the step S15. According to the method, the current disordered and diverse decura data formats can be unified, and the management and control difficulty of panel manufacturers on products is greatly reduced.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a demura data application method in a unified format. Background technique [0002] In different positions of the TFT-LCD panel, it is easy to have inconsistent brightness under the same backlight due to insufficient uniformity of the manufacturing process. These areas of inconsistent brightness are called mura. In order to improve the image quality of the TFT-LCD panel, the timing controller chip (TCON IC) driving the TFT-LCD panel is generally equipped with a demura (mura compensation) function. [0003] The demura function reads the panel demura data stored in the flash memory (flash), obtains the mura situation at different positions of the current panel, and then performs appropriate data compensation for the input image data according to the mura degree of the corresponding position, thereby reducing the panel display The degree of mura of the image to appear. The panel...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/36
CPCG09G3/36G09G2320/0233G09G2370/04G09G3/3629G09G3/3655G09G2310/08
Inventor 何冠贤刘克远
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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