Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Learning condition analysis method, electronic equipment and storage medium

An analysis method and a technology of academic situation, applied in the field of academic situation analysis, can solve problems such as the inability to fully reflect the status of students in school and the single function of face recognition products

Pending Publication Date: 2019-08-09
深圳市深网视界科技有限公司
View PDF7 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the problem that the face recognition products in the existing education field have single functions and cannot fully reflect the students' school status, the purpose of the present invention is to provide a method for analyzing academic conditions, electronic equipment and storage media

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Learning condition analysis method, electronic equipment and storage medium
  • Learning condition analysis method, electronic equipment and storage medium
  • Learning condition analysis method, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] Below, the present invention will be further described in conjunction with the accompanying drawings and specific implementation methods. It should be noted that, under the premise of not conflicting, the various embodiments described below or the technical features can be combined arbitrarily to form new embodiments. .

[0046] Such as figure 1 As shown, the application scene diagram of the method for analyzing the academic situation provided by the embodiment of the present invention, the method is applied in the system for analyzing the academic situation, and the system includes the camera device 1 installed in the classroom, the camera device 2 installed in the library, and the camera device installed in the library. The camera equipment 3 in the dormitory, the camera equipment 4 installed in the cafeteria, the server 5 and the client 6. The server 5 executes the learning situation analysis method of the embodiment of the present invention, so as to fully reflect ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a learning condition analysis method. The method comprises the steps that classroom human body images shot by camera shooting equipment installed in a classroom, library humanface images shot by the camera shooting equipment installed in a library, dormitory access condition human face images shot by the camera shooting equipment installed in a dormitory and diet conditionhuman face images shot by the camera shooting equipment installed in a dining hall are acquired; analyzing the class attendance condition, the class concentration condition, the class enthusiasm condition, the after-class learning condition, the rest time of the student and the diet condition of the student; and according to the learning performance, the classroom attendance condition, the classroom concentration condition, the classroom enthusiasm condition, the after-class learning condition, the rest time and the diet condition, the learning and living conditions of the students are analyzed. The invention further discloses electronic equipment and a storage medium, and the learning condition analysis method, the electronic equipment and the storage medium provided by the invention cancomprehensively reflect the state of the student in school, so that problems can be timely found and corrected.

Description

technical field [0001] The invention relates to the field of artificial intelligence, in particular to a method for analyzing academic situation. Background technique [0002] In the current primary and secondary education, parents pay the most attention to the students' learning situation at school, and the resources of campus teachers are limited, which cannot truly reflect the students' learning situation at school. There is a large gap between test scores and teacher feedback Hysteresis. Most of the existing home-school communication software can only exchange basic information such as test scores and homework, and it is difficult for schools and parents to exchange information such as students' classroom attendance status. [0003] With the rapid development of artificial intelligence technology, artificial intelligence technology has been applied more and more in the field of education. However, the existing face recognition products in the field of education have pro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06Q10/06G06Q50/20G06K9/00G16H20/60G16H50/30
CPCG06Q10/0639G06Q50/205G16H20/60G16H50/30G06V40/166G06V20/52
Inventor 王泽楷王涛
Owner 深圳市深网视界科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com