Point target detection method and system based on machine learning
A technology of machine learning and detection methods, applied in the fields of instruments, computer parts, calculations, etc., can solve problems such as parameter sensitivity, damage calculation process, complexity, etc., to achieve accurate and robust detection results, and accurate classification results.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
example
[0096] Extract 250,000 sub-images of size 7*7 from 30 infrared cloud images. There is no target in the original image, so the original sub-image is a negative sample. For each sub-image, point targets are added to obtain positive samples by using point target simulation techniques. The target brightness is uniformly distributed in the interval [4*σ, 8*σ], where σ represents the standard deviation of the original image pixel values. The target position is at the center point of the sub-image, and has a random pixel offset (Δm, Δn), where Δm and Δn follow a uniform distribution in the interval [-0.5, 0.5]. Therefore, the dataset contains 500,000 samples, where the ratio of positive and negative samples is 1:1.
[0097] After the data set is ready, model training and testing are required. The specific process is as follows:
[0098] ① Randomly select 400,000 samples from the sub-image set to train the BP neural network classifier, and set the learning rate to 0.0001. In order...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com