Non-contact displacement and strain measuring method based on image feature recognition technology
A recognition technology and image feature technology, which is applied in the field of non-contact displacement and strain measurement based on image feature recognition technology, can solve the problems that the measurement accuracy of digital image correlation method cannot be guaranteed, the measurement environment is more demanding, and the correlation of speckle images decreases. , to achieve the effect of automatic data processing, mild experimental conditions, and improved accuracy and stability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0042] Below in conjunction with accompanying drawing and embodiment the present invention is further described, as Figure 6 As shown, taking the speckle image on the surface of a rubber material as an example, a non-contact displacement strain measurement method based on image feature recognition technology provided by the present invention is described, which specifically includes the following steps:
[0043] Step 1, Gaussian filtering is performed on the speckle image on the surface of the rubber material [1] Denoising, images before and after Gaussian filtering such as figure 1 ;
[0044] [1] Si Shaohui, Hu Fuyuan, Gu Yajun, et al. A Gaussian filter denoising algorithm based on irregular regions [J]. Computer Science, 2014, 41(11): 313-316.
[0045] Step 2, after inputting the pre-deformation and post-deformation images into the computer, it is necessary to set relevant parameters (image reference sub-area size, region of interest), then input the displacement measurem...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com