Rapid imaging method of atomic force microscope

An atomic force microscope and imaging method technology, applied in the field of precision instruments, can solve the problems of high computational complexity of sparse signals, occupy large storage space, and large dimensions of measurement matrix, so as to improve signal reconstruction efficiency, reduce damage, improve efficiency and The effect of precision

Inactive Publication Date: 2019-05-17
JIANGNAN UNIV
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Problems solved by technology

The problems of this compressed imaging method of atomic force microscope are: the computational complexity is high and the time is long in the process of sparse signal reconstruction; the measurement matrix is ​​large in dimension, which requires a large amount of storage space. Imaging applications are limited

Method used

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  • Rapid imaging method of atomic force microscope
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Embodiment Construction

[0043] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, so that those skilled in the art can better understand the present invention and implement it, but the examples given are not intended to limit the present invention.

[0044] refer to Figure 1-2 As shown, a fast imaging method of an atomic force microscope, the specific steps include:

[0045] Step 1: Establish a two-dimensional compressed sensing model;

[0046] Step 2: Design a sampling matrix pair suitable for two-dimensional compressed imaging of atomic force microscope based on two-dimensional compressed sensing;

[0047] Step 3: Calculate the sampling coordinate points based on the sampling matrix pair, and calculate the shortest path of the probe during the imaging process of the atomic force microscope through the optimal algorithm;

[0048] Step 4: Import the shortest path coordinates of the probe into the AFM imaging system, obtain ...

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Abstract

The invention relates to the field of precision instruments in micro-nano science and technology studies, in particular to a rapid imaging method of an atomic force microscope. The invention proposesand realizes a rapid imaging method of an atomic force microscope based on a two-dimensional regularization iterative hard threshold algorithm to improve the efficiency and accuracy of the atomic force microscope during imaging. Compared with a conventional imaging method of the atomic force microscope, by adopting the imaging method provided by the invention, the imaging sampling time of the atomic force microscope is reduced through compression sampling, the damages of a probe to a sample are reduced, and the damages to the sample surface caused by excessive contact between the probe tip andthe sample surface are reduced; and meanwhile, the calculation complexity of two-dimensional sparse signals is greatly reduced based on the two-dimensional regularization iterative hard threshold algorithm, the signal reconstruction efficiency is improved, the imaging rate of the atomic force microscope is greatly improved, and the sample damages caused by the contact between the probe tip and the sample are obviously reduced.

Description

technical field [0001] The invention relates to the field of precision instruments in micro-nano science and technology research, in particular to a fast imaging method for an atomic force microscope. Background technique [0002] The atomic force microscope uses the interaction force between atoms, and the distance between atoms has a certain functional relationship with the force between two atoms. The atomic force microscope detects and amplifies the atomic force between the probe tip of the microscope and the sample, and directly converts the height of the sample surface to obtain the surface topography of the sample. Atomic force microscopes are widely used in cutting-edge scientific and technological fields such as nanomaterials and biomedicine because of their ultra-high detection accuracy at the nanometer level. [0003] Today's atomic force microscopes "scrape" the surface of the sample through the "grid" of the probe, and at the same time obtain the relative heigh...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/24
Inventor 李恭新刘飞陈珺
Owner JIANGNAN UNIV
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