Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Arbitrary waveform generator amplitude frequency sweeping multi-scale calibration method and device

A waveform generator and arbitrary waveform technology, applied in the direction of measuring devices, instruments, measuring electrical variables, etc., can solve the problems of large fluctuations in frequency band errors, failure to consider differences in circuits or components, and missing key information, etc., to achieve Guaranteed output accuracy, improved calibration accuracy, and accurate calibration effects

Active Publication Date: 2019-04-19
CHINA ELECTRONIS TECH INSTR CO LTD
View PDF9 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Usually, the interval between calibration samples is preset, and the same calibration samples are used for different instruments, without taking into account the differences caused by circuits or components.
If the linearity of the frequency response curve is poor, the error of some frequency bands will fluctuate greatly. Using equally spaced calibration samples for the calibration of this frequency band may miss a lot of key information, and the calibration accuracy cannot be guaranteed.
[0006] To sum up, at present, there is still a lack of effective solutions to the problem of performing calibration of samples at different intervals for differentiated platforms and improving the calibration accuracy of frequency bands with large error fluctuations.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Arbitrary waveform generator amplitude frequency sweeping multi-scale calibration method and device
  • Arbitrary waveform generator amplitude frequency sweeping multi-scale calibration method and device
  • Arbitrary waveform generator amplitude frequency sweeping multi-scale calibration method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0043] It should be noted that the following detailed description is exemplary and intended to provide further explanation of the present disclosure. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs.

[0044] It should be noted that the terminology used herein is only for describing specific embodiments, and is not intended to limit the exemplary embodiments according to the present disclosure. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinations thereof.

[0045] In the existing calibration methods, the selection of calibration samples is mostly equal-spaced calibration samples in ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an arbitrary waveform generator amplitude frequency sweeping multi-scale calibration method and device. The intervals between calibration sampling points can be adjusted according to the fluctuation degree of errors, the intervals between the calibration sampling points are large when an error curve is smooth, the intervals between the calibration sampling points are smallwhen the error curve greatly fluctuates, and then calibration of different scales is achieved. The method includes the following steps that a frequency response error signal is acquired; the frequencyresponse error signal is subjected to windowing framing, and multiple frame signals are obtained; the energy mean value of each frame signal is calculated, an energy envelop of the frequency responseerror signal is obtained, and the mean value of the energy envelop of the frequency response error signal is calculated; the judgment threshold value of segmentation of the error signal and the intervals between the calibration sampling points are determined; calibration frequency bands of the frequency response error signal are segmented, and the intervals between the calibration sampling pointsand the number of the calibration sampling points in the corresponding frequency bands are determined; the corresponding frequency bands are calibrated through the calibration sampling points.

Description

technical field [0001] The disclosure belongs to the field of arbitrary waveform generator calibration, and particularly designs an amplitude sweep multi-scale calibration method and device suitable for arbitrary waveform generators. Background technique [0002] Arbitrary waveform generator is an editable multi-function signal source, which can generate general function waveforms, special application waveforms and complex editable waveforms, and can also output environmental simulation signals to realize the transition from signal simulation to real-world test environment, widely Used in communication, aviation, medical and other fields. Arbitrary waveform generators can cooperate with computer technology to generate arbitrary signals with limited bandwidth required by users, and provide high-bandwidth, high-resolution, and high-precision test signals for multi-field testing. [0003] To truly reproduce the set arbitrary waveform signal, the output accuracy of the arbitrar...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
CPCG01R35/005
Inventor 李旭滕友伟刘宇吴恒奎
Owner CHINA ELECTRONIS TECH INSTR CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products