A light source structure based on universal ate test cis products

Abstract

The invention discloses a light source structure for testing CIS products based on general ATE, including an LED light source box and a controller, an ATE interface board and a fixed structure; LEDs are installed in the LED light source box, and the controller is used to control the LED output to meet the test conditions. Light source; there are control chips and circuits in the controller to realize the function of controlling LEDs, and the ATE interface board is a PCB connecting ATE and chips; the light source structure based on general ATE testing CIS products provided by the present invention, a complete set of external equipment , the installation does not need to change the ATE structure. Even if there is a problem with the light source, it can be replaced in a short time without turning off the ATE. It saves time and cost, is easy to transform, and is suitable for mass production.

Description

technical field [0001] The invention relates to the technical field of integrated circuit equipment and testing, in particular to a light source structure required for CIS wafer testing. Background technique [0002] Existing technology: A dedicated ATE will be used for testing CIS wafers. This ATE will be equipped with a light source, and the light source is integrated inside the ATE, and the light source is specially designed and manufactured according to the structure of the ATE, which can provide high precision and good uniformity. , adjustable spectrum, and adjustable color temperature light source, so the overall price will be more expensive than the same type of ATE without a light source, that is, the ordinary type. In addition, the light transmission area of ​​the dedicated ATE light source is small, which limits the number of parallel measurements. At the same time, short-lived halogen lamps are used, and the bulbs need to be replaced regularly to maintain the acc...

AI Technical Summary

Problems solved by technology

[0002] Existing technology: A dedicated ATE will be used for testing CIS wafers. This ATE will be equipped with a light source, and the light source is integrated inside the ATE, and the light source is specially designed and manufactured according to the structure of the ATE, which can provide high precision and good uniformity. , adjustable spectrum, and adjustable color temperature light source, so the overall price will be more expensive than the same type without light source, that is, ordinary ATE

In addition, the light transmission area of ​​the dedicated ATE light source is small, which limits the number of parallel measurements

At the same time, short-lived halogen lamps are used, and the bulbs need to be replaced regularly to maintain the accuracy of the light source. In this way, the special testing machine must be turned off and the light source must be disassembled, which affects the test capacity and pushes up the cost of testing.

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