Method and system for increasing the number of test samples in high-temperature environment aging test

An aging test and test sample technology, applied in the field of high temperature environmental aging test, can solve the problem of not too many test samples, limit test efficiency and other problems, and achieve the effect of increasing the number of test samples, saving electricity, and adjusting accurately and quickly

Active Publication Date: 2021-05-14
PRIME REL ELECTRONIC TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0010] In summary, when using the current high-temperature environment test chamber for high-temperature environment aging life test, the number of test samples should not be too large, which limits the test efficiency

Method used

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  • Method and system for increasing the number of test samples in high-temperature environment aging test
  • Method and system for increasing the number of test samples in high-temperature environment aging test
  • Method and system for increasing the number of test samples in high-temperature environment aging test

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Embodiment Construction

[0031] The present invention will be further described below in conjunction with specific drawings and embodiments.

[0032] Such as figure 2 and image 3 Shown: In order to accurately and quickly adjust the opening degree of the damper, greatly increase the number of test samples allowed, and can save electric energy to the greatest extent, and ensure the smooth progress of the test. Environmental test chamber; also comprise the damper damper control mechanism that can control the damper damper 9 opening state of environmental test chamber, described damper damper control mechanism is electrically connected with system controller, configures temperature tolerance σ, The change step size Δβ of the opening angle α of the damper baffle 9, the temperature control feedback period T wait and the thermal balance perturbation period T check ; The method comprises the steps of:

[0033] Step S1, determine the target constant temperature T in the environmental test chamber accordi...

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Abstract

The invention relates to a method and system for increasing the number of test samples in a high-temperature environmental aging test, which includes an environmental test chamber capable of providing the required environment for the environmental aging test of the device under test; State of the damper control mechanism. During the test, according to the current opening angle α of the damper baffle and the current temperature T in the environmental test chamber real , adjust the opening angle α of the air door baffle accurately and quickly through the air door baffle control mechanism, so as to change the maximum allowable heating power of the test system, so that the test system can accommodate more test samples on the one hand, and save electric energy to the greatest extent on the other hand , to ensure the smooth progress of the test.

Description

technical field [0001] The invention relates to a method and a system, in particular to a method and a system for increasing the number of test samples in a high-temperature environment aging test, belonging to the technical field of high-temperature environment aging tests. Background technique [0002] High temperature environmental aging life test is a common method to evaluate the quality of semiconductor devices, such as HTRB (High Temperature Reverse Bias, high temperature reverse bias test), HTGB (High Temperature Gate Bias, high temperature gate bias test), HTFB (High Temperature Forward Bias, high temperature Positive bias test), HTOL (High Temperature Operating Life, high temperature working life), etc. The principle of high-temperature environmental aging life test is to place semiconductor devices under high-temperature environmental conditions and apply specific electrical stress to quickly evaluate their life and reliability by accelerating the aging process of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R31/2642
Inventor 张文亮雷小阳李文江朱阳军
Owner PRIME REL ELECTRONIC TECH CO LTD
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