Method and system capable of being compatible with various environmental aging tests

An aging test and environmental technology, applied in the direction of single semiconductor device testing, measuring devices, instruments, etc., can solve the problems of low utilization rate of equipment, large space occupation, high procurement cost and high operation and maintenance cost, so as to reduce procurement cost, save space, The effect of improving the overall utilization rate

Active Publication Date: 2019-04-09
山东阅芯电子科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, since the six types of tests need to purchase six types of test equipment, the overall purchase cost of equipment and subsequent operation and maintenance costs are high, the utilization rate of the six equipment is low, and it takes up a lot of space

Method used

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  • Method and system capable of being compatible with various environmental aging tests
  • Method and system capable of being compatible with various environmental aging tests
  • Method and system capable of being compatible with various environmental aging tests

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Embodiment Construction

[0034] The present invention will be further described below in conjunction with specific drawings and embodiments.

[0035] In order to utilize the same equipment to realize multiple environmental aging tests at the same time, improve the comprehensive utilization rate of the test, reduce the installation space and use cost, the present invention includes a test environment device and a test test circuit, and the test environment device can be used to Provide the test environment required for the power device under test in the environmental aging test, and use the test test circuit to provide the electrical conditions required for the power device under test in the environmental aging test, so that the required reverse bias test can be performed on the power device under test Or grid bias test; the test environment that the test environment device can provide includes low temperature environment, high temperature environment and high temperature and high humidity environment; ...

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Abstract

The invention relates to a method and a system capable of being compatible with various environmental aging tests. The system comprises a test environment device and a test circuit; the test environment device can be used to provide a test environment required by a to-be-tested power device in the environmental aging test; the test circuit can be used to provide electrical conditions needed by theto-be-tested power device in the environmental aging test, so that a required reverse bias test or grid bias test can be carried out on the to-be-tested power device; the test environment which can be provided by the test environment device includes a low-temperature environment, a high-temperature environment and a high-temperature and high-humidity environment; through cooperation of the test environment provided by the test environment device and/or the electrical conditions loaded by the test circuit, the required environmental aging test can be carried out on the to-be-tested power device; and the various environmental aging tests can be realized at the same time by utilizing the same device, so that the comprehensive utilization rate of the test is improved, and the installation space, the purchasing cost and the follow-up operation and maintenance cost are reduced.

Description

technical field [0001] The invention relates to a method and a system, in particular to a method and a system compatible with various environmental aging tests, and belongs to the technical field of power device testing. Background technique [0002] HTRB (High Temperature Reverse Bias, high temperature reverse bias test), the test places the semiconductor device in a high temperature environment at a specific temperature, and makes the semiconductor device withstand a specific reverse bias voltage, by testing the life of the semiconductor device under this working condition and characteristic changes to evaluate the reliability of the device under test. [0003] h 3 TRB (High Humidity High Temperature Reverse Bias, high temperature and high humidity reverse bias test): The test places the semiconductor device in a high temperature and high humidity environment with a specific temperature and humidity, and makes the semiconductor device withstand a specific reverse bias vol...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2607
Inventor 张文亮李文江孙浩强雷小阳朱阳军
Owner 山东阅芯电子科技有限公司
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