Instrument and method for rapid analysis of cross-scale inclusions based on photomicrograph matrix

Abstract

The invention relates to a cross-scale automatic inclusion rapid analysis instrument and method based on a microphotographic matrix. The analytical instrument includes a photomicrograph matrix system, a high-precision three-dimensional numerical control workbench, a computing workgroup, and a control and data processing system; On the Z-axis of the CNC workbench, the computing workgroup controls the displacement of the high-precision three-dimensional CNC workbench through the control and data processing system, and gradually moves the position of the sample to be tested, so that the microphotographic matrix system traverses the surface of all samples to be tested , realize the full-scale photomicrograph of the sample to be tested, carry out inclusion search, area calculation, positioning, topography grading and magnification, and statistical distribution analysis. The invention combines the microphotographic matrix and high-speed operation, and the sample scanning size is large, the precision is high, and the speed is fast, and the analysis efficiency of large-scale sample inclusions is significantly improved.

Description

technical field [0001] The invention belongs to the technical field of high-throughput microscopic characterization of material surfaces, and particularly relates to a cross-scale automatic inclusion rapid analysis instrument and method based on a microphotographic matrix. Background technique [0002] The key core components of major projects are usually large-scale metal components. Inclusions in large-scale metal components are an important factor in the failure of key components in aviation, high-speed rail and other industries. At present, there is no automatic detection method for direct and rapid measurement of inclusions in large-scale metal components at home and abroad. Conventional optical microscope metallographic methods can only detect surface inclusions of metal components within 10mm × 10mm. Large-scale samples need to be cut into samples suitable for ordinary metallographic analysis. The processing is time-consuming and labor-intensive, and the efficiency i...

AI Technical Summary

Problems solved by technology

Conventional optical microscope metallographic methods can only detect inclusions on the surface of metal components within a size of 10mm×10mm. It is necessary to cut large-scale samples into samples suitable for ordinary metallographic analysis. Processing is time-consuming, laborious, inefficient, and some surface parameters May be distorted due to cutting process

Therefore, ordinary metallographic microscopy techniques can only deal with small-sized samples, and cannot obtain metallographic information such as inclusions in cross-scale samples.

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