A method for predicting that storage life of a data product

A technology of data products and storage life, which is applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., and can solve problems such as inappropriateness and prediction result errors

Pending Publication Date: 2019-02-19
BEIJING INST OF STRUCTURE & ENVIRONMENT ENG +1
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  • Application Information

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Problems solved by technology

But there is a problem in this way: due to the temperature drift effect of online test data, it is inappropriate to directly use it for product life prediction, and only use offline test data to predict product life, and because of the small amount of data, the prediction results have some problems. error

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  • A method for predicting that storage life of a data product
  • A method for predicting that storage life of a data product
  • A method for predicting that storage life of a data product

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Embodiment Construction

[0083] In addition to the embodiments described below, the invention can be embodied in other embodiments or carried out in different ways. It is, therefore, to be understood that the invention is not limited to the details of construction of the components described in the following description or shown in the drawings.

[0084] Below in conjunction with the accelerated performance degradation test and the storage life prediction example of conductive film resistance, the present invention is described in further detail, as figure 1 as shown,

[0085] Step 1. Carry out accelerated performance degradation test based on temperature stress

[0086] 21 conductive film resistor samples were put into the accelerated performance degradation test. The test was carried out by applying constant temperature stress. Four different stress levels were taken, namely 60°C, 85°C, 110°C and 140°C. Arrangements were made at the 60°C stress level 8 test samples, 5 test samples at 85°C stress l...

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Abstract

A method for predict that storage life of a data product is provided. The accelerated degradation data of the product under various stress levels obtained from on-line and off-line tests. A storage life evaluation method of data products based on on-line data and off-line data is proposed. The pseudo-life of the data products under various accelerated stress levels is obtained by this method, andthe storage life of the data products under normal stress is evaluated by combining the temperature accelerated model. Making full use of on-line test data and adopting equivalent off-line performanceparameter data to effectively increase the amount of available information in the process of pseudo-failure life estimation and improve the precision of pseudo-failure life estimation. The temperature factor is introduced to transform the on-line test data into equivalent off-line data effectively, and the product life assessment can be completed more effectively by making full use of the data obtained from the test. The linear activation energy theory is introduced to make the selection of acceleration model more reasonable. The modified three-parameter Arrhenius equation is selected as acceleration model.

Description

technical field [0001] The invention belongs to the technical field of reliability, in particular to a method for predicting the storage life of data products. Background technique [0002] With the improvement of product life and reliability level, it is difficult to obtain failure data under product storage conditions, which makes the traditional life and reliability evaluation model based on failure data difficult to meet the requirements of engineering evaluation. In order to solve such problem, the accelerated test is introduced into the field of life and reliability evaluation. By increasing the environmental stress level of the product, carrying out laboratory simulation tests, and obtaining the performance degradation data of the product under high stress conditions, and then using trajectory fitting and acceleration models, external Extending the life of products under normal stress conditions has become an important way to solve the reliability evaluation problem o...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F2119/04G06F2119/08G06F30/20Y02P90/30
Inventor 陈志军周芳杨学印胡彦平王薇范晔杨璐李鑫淼陈靖怡许玉珍
Owner BEIJING INST OF STRUCTURE & ENVIRONMENT ENG
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