Test center data acquisition and analysis system
A technology for data acquisition analysis and test centers, applied in general control systems, control/adjustment systems, instruments, etc., can solve problems such as data loss that cannot be prevented, and achieve the effects of saving time, preventing data loss, and improving practicability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0015] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0016] see figure 1 , the data acquisition and analysis system of the test center, including a central processing unit, the input end of the central processing unit is electrically connected to a power supply module, the power supply module is a storage battery, and the central processing unit can be powered by setting the storage battery, and the input terminal of the central processing unit is electrically connected There is a secondary information analysis ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com