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Test center data acquisition and analysis system

A technology for data acquisition analysis and test centers, applied in general control systems, control/adjustment systems, instruments, etc., can solve problems such as data loss that cannot be prevented, and achieve the effects of saving time, preventing data loss, and improving practicability

Inactive Publication Date: 2019-01-18
湖北三好电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a test center data collection and analysis system, which has the advantage of preventing data loss and solves the problem that the existing test center data collection and analysis system cannot prevent data loss

Method used

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  • Test center data acquisition and analysis system

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Embodiment Construction

[0015] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0016] see figure 1 , the data acquisition and analysis system of the test center, including a central processing unit, the input end of the central processing unit is electrically connected to a power supply module, the power supply module is a storage battery, and the central processing unit can be powered by setting the storage battery, and the input terminal of the central processing unit is electrically connected There is a secondary information analysis ...

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Abstract

The invention discloses a test center data acquisition and analysis system, comprising a central processing unit, wherein the input end of the central processing unit is electrically connected with apower supply module, and the input end of the central processing unit is electrically connected with a secondary information analysis module. By providing a central processing unit, a power supply module, a secondary information analysis module, an information analysis module, a data collection module, a display module, a radio transmission module, a radio receiving module, a backup storage module, a backup storage sharing module, an encryption module and a storage module in cooperation in the invention, the test data is stored in the storage module and the backup storage module, the data is transmitted to the central processing unit through the backup storage sharing module when the data of the storage module is lost, and the data is transmitted to the display module through the central processing unit for display, thereby solving the problem that the existing test center data acquisition and analysis system cannot prevent data loss.

Description

technical field [0001] The invention relates to the technical field of data collection and analysis systems for test centers, in particular to a data collection and analysis system for test centers. Background technique [0002] Data is the result of facts or observations, a logical induction of objective things, and unprocessed raw materials used to represent objective things. Data acquisition refers to the data collected from analog and digital units under test such as sensors and other equipment under test. Automatically collect non-power or power signals, and send them to the host computer for analysis and processing. The data acquisition system is a flexible and user-defined measurement system combined with measurement software and hardware products based on computers or other special test platforms. The data acquisition and analysis system of the test center is a kind of data acquisition, but the existing test center data acquisition The analysis system cannot prevent...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B15/02
CPCG05B15/02
Inventor 张开蔺
Owner 湖北三好电子有限公司
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