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A detector calibration method for quadrupole mass spectrometer

The technology of a quadrupole mass spectrometer and a calibration method is applied in the field of detector calibration of the quadrupole mass spectrometer, and can solve the problem that the PA calibration method of the inductively coupled plasma mass spectrometer has no relevant reports, and achieves improved linear dynamic range, The effect of improving detection performance

Active Publication Date: 2020-04-03
NCS TESTING TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] At present, there is no relevant report on the PA calibration method of inductively coupled plasma mass spectrometer

Method used

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  • A detector calibration method for quadrupole mass spectrometer
  • A detector calibration method for quadrupole mass spectrometer
  • A detector calibration method for quadrupole mass spectrometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0073] (1) The instrument used in this example is ICP-MS (Inductively Coupled Plasma Mass Spectrometer).

[0074] (2) Test the standard solution described in A1 to obtain the original pulse count value and the original analog count value of each element. Taking the V and Tl elements as an example, draw the calibration curves of the V and Tl elements before correction, as shown in figure 1 and Figure 4 shown.

[0075] (3) determine the linear range of the original pulse count intensity and the original analog count intensity of the element to be measured, and draw the threshold value of the pulse count intensity by the data of (2) (X1=500, X2=10 5 ), the threshold of simulated counting intensity is (Y1=10 4 , Y2=10 6 ).

[0076] (4) According to the order of the mass numbers from low to high, select 5 sets of data for each of the 5 calibration elements (Be, Co, Y, In, Ce, Bi) in the standard solution, and obtain the values ​​of these 5 calibration elements. Correction co...

Embodiment 2

[0079] (1) The instrument used in this example is ICP-MS.

[0080] (2) Prepare a standard solution containing V and Tl elements with a solubility of 0.5 to 200 μg / L (0.5, 1, 5, 10, 20, 50, 80, 100, 150, 200), and prepare a standard solution containing V and Tl elements For the sample to be tested, the concentration range of the sample is 0.5-200 μg / L, and the selected concentration is 2, 15, 60, 90, 120, 180 μg / L.

[0081] (3) Measure the original pulse count intensity and the original analog count intensity of V and T1 elements in the standard solution with ICP-MS, and the threshold value for obtaining the pulse count intensity is (X1=500, X2=10 5 ), the threshold of simulated counting intensity is (Y1=10 4 , Y2=10 6 )

[0082] (4) Measure the original pulse count intensity and original analog count intensity of V and Tl elements in the sample to be tested with ICP-MS, and select 3 groups of original pulse count intensity and original analog count intensity data for each e...

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Abstract

The invention belongs to the technical field of mass spectrometers, in particular to a detector calibration method for a quadrupole mass spectrometer. The calibration coefficients are obtained by theelements for calibration or the elements to be measured, and the calibration curves and contents of the elements in the sample to be measured are obtained by calculating the calibrated analog countingintensity. The invention uses a cubic curve fitting method to cross-calibrate the pulse counting and analog counting of the detector, standardizes the two counting ranges, improves the linear dynamicrange of the detector and improves the detection performance of the instrument.

Description

technical field [0001] The invention belongs to the technical field of mass spectrometers, in particular to a detector calibration method for quadrupole mass spectrometers. Background technique [0002] Mass spectrometer is one of the most widely used scientific instruments with the best development prospects in today's scientific instruments. Mass spectrometry can quickly and simultaneously detect almost all elements on the periodic table, and has become recognized as the most powerful means of elemental analysis. The mass spectrometer is mainly composed of the following parts: sample introduction system, ion source, interface part, ion focusing system, mass analyzer, detector, etc. According to the different types and principles of mass analyzers, mass spectrometers can be divided into magnetic deflection mass spectrometers, ion trap mass spectrometers (IT-MS), time-of-flight mass spectrometers (TOF-MS), and Fourier transform ion cyclotron resonance mass spectrometers. (...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/02H01J49/42
CPCH01J49/025H01J49/42
Inventor 李凯唐兴斌李曼李明王小龙陆翌欣任立志胡少成
Owner NCS TESTING TECH
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