A Distributed Fault Diagnosis Method for Circuit System

Abstract

The invention discloses a distributed fault diagnosis method of a circuit system. The sensor is the basic unit, the measured value of the sensor is the local output of the circuit system, the minimum subsystem based on each sensor is extracted from the circuit system, and the local diagnostic bond graph model of each minimum subsystem is obtained respectively; according to the minimum subsystem The local diagnosis bond graph model is used to obtain the distributed analytical redundancy relationship, and the distributed analytical redundancy relationship is analyzed to obtain a distributed fault characteristic matrix; fault diagnosis is performed according to the distributed fault characteristic matrix. The present invention effectively improves the performance of fault isolation in the case of single fault and multiple faults, reduces the complexity of subsequent fault component identification, and improves the fault diagnosis speed and diagnostic accuracy.

Description

technical field [0001] The invention relates to the field of fault diagnosis of circuit systems, in particular to a distributed fault diagnosis method of circuit systems. Background technique [0002] In modern industrial production, many complex electrical and mechanical circuit systems have been produced, such as complex integrated circuit systems, electromechanical circuit systems, and hydraulic circuit systems. In order to improve the safety and reliability of the circuit system, fault diagnosis and The importance of real-time monitoring has also become increasingly prominent. [0003] As the complexity of the circuit system increases, the difficulty of fault diagnosis of the circuit system also increases. The common fault diagnosis method is to model the circuit system based on the bonding graph, and obtain the global diagnostic bonding graph model of the circuit system. According to the circuit The system global diagnosis bond graph model directly obtains the global f...

AI Technical Summary

Problems solved by technology

However, this global fault diagnosis method will have the following main problems as the complexity of the circuit system increases: 1. Under single fault conditions, because some components in the circuit system have the same fault characteristics, fault isolation cannot be achieved; 2. Under the condition of multiple faults, because the fault characteristics of some components in the circuit system will cancel or cover each other, fault isolation cannot be achieved

At the same time, the performance of fault isolation will affect the complexity of subsequent fault component identification. The more components the possible fault set obtained from fault isolation contains, the higher the complexity of fault component identification and the lower the identification accuracy.

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