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Application program testing method, application program testing device, storage medium and electronic device

A technology of application programs and testing methods, which is applied in the field of testing, can solve the problems of low application testing efficiency and achieve the effect of improving testing efficiency

Active Publication Date: 2018-11-30
TENCENT TECH CHENGDU
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Embodiments of the present invention provide an application program testing method, device, storage medium, and electronic device to at least solve the technical problem of relatively low application program testing efficiency

Method used

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  • Application program testing method, application program testing device, storage medium and electronic device
  • Application program testing method, application program testing device, storage medium and electronic device
  • Application program testing method, application program testing device, storage medium and electronic device

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Embodiment Construction

[0022] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of the embodiments of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0023] It should be noted that the terms "first" and "second" in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and not necessarily used to describe a specific sequence or sequence. It should be understood that the data used in this way can be interchanged under ap...

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PUM

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Abstract

The invention discloses an application program testing method, an application program testing device, a storage medium and an electronic device. The method includes identifying current modules from ato-be-tested installation package of an application program; acquiring information of historical modules of a target installation package of the application program, wherein the target installation package and the to-be-tested installation package are installation packages in two adjacent versions of the application program, and the version of the application program corresponding to the target installation package is earlier than the version of the application program corresponding to the to-be-tested installation package; comparing information of the current modules with information of the historical modules; sending out prompt information when changes are made to the current modules relative to the historical modules, wherein the prompt information is used for prompting a user to test functions of changed modules in the current modules. By the application program testing method, the technical problem of low testing efficiency of the application program is solved.

Description

Technical field [0001] The present invention relates to the field of testing, and in particular to a testing method, device, storage medium and electronic device of an application program. Background technique [0002] At present, in order to verify the correctness of the application function in the quality audit of the application, in addition to testing the correctness of the application function according to the application function white paper, it is also necessary to check whether the function implemented by the application program is correct. At present, for the review of the related functions that depend on the implementation of the components in the project, the reviewer needs to actively ask the components and version numbers used, and conduct a full test of the related functions. [0003] In the existing solutions, the components and component version numbers used are obtained by manual inquiry and independent local maintenance by testers, leading to missing components or...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3612G06F11/3688
Inventor 夏春兰严明魏学峰
Owner TENCENT TECH CHENGDU
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