Environmental test plan design method and device
A technology of environmental testing and scheme design, applied in the direction of measuring devices, vibration testing, impact testing, etc., can solve problems such as increased testing costs, lack of environmental testing data, and inability to guarantee the efficiency of environmental testing, and achieve the goal of reducing testing costs and improving efficiency Effect
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Embodiment 1
[0073] Such as figure 1 As shown, it is a schematic flow chart of the implementation of the environmental test scheme design method provided in Embodiment 1 of the present invention, which may include the following steps:
[0074] S11. For each test item, determine the test pass rate and fault sensitivity index of the test item according to the historical test data, the test pass rate is used to represent the proportion of historical test products passing the test item, and the fault sensitivity index is used It is used to characterize the failure sensitivity of historical test products participating in this test item.
[0075] During specific implementation, the test items of the environmental test may include but not limited to the following: high temperature test, low temperature test, temperature cycle test, alternating / constant damp heat test, vibration test, humidity test, salt spray test, impact test, solar radiation Test, low air pressure test, mold test, dust test, v...
Embodiment 2
[0117] Based on the same inventive concept, Embodiment 2 of the present invention provides an environmental test scheme design device. Since the principle of the above-mentioned device to solve the problem is similar to the above-mentioned environmental test scheme design method, the implementation of the above-mentioned device can refer to the implementation of the method. No longer.
[0118] Such as figure 2 As shown, it is a schematic structural diagram of the environmental test scheme design device provided in Embodiment 2 of the present invention, which may include:
[0119] The first determining unit 21 is used to determine the test pass rate and fault sensitivity index of the test item according to the historical test data respectively for each test item, and the test pass rate is used to characterize the ability of the test item to stimulate product failure, The fault sensitivity index is used to characterize the efficiency of the test item to discover product faults...
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