A method and testing device for judging the reliability of a flash memory chip based on operating time or current

A flash memory chip, operating time technology, applied in static memory, instruments, etc., can solve the problem of inability to prevent data loss in flash memory, and achieve accurate judgment results and prevent data loss.

Active Publication Date: 2021-04-27
武汉置富半导体技术有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The method based on the error rate is easily affected by the value of the stored data and must be judged by the error rate after reading the data. This method cannot prevent data loss caused by the sudden failure of the flash memory

Method used

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  • A method and testing device for judging the reliability of a flash memory chip based on operating time or current
  • A method and testing device for judging the reliability of a flash memory chip based on operating time or current
  • A method and testing device for judging the reliability of a flash memory chip based on operating time or current

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Embodiment Construction

[0046] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0047] figure 1 For the present invention realizes the schematic flow chart of judging the reliability of a flash memory chip based on operating time and current, the judgment process shown in the figure is applicable to all types of flash memory chips, and a kind of flash memory chip product is used as an embodiment below figure 1 Give a detailed explanation.

[0048] In this embodiment, a multi-level cell NAND flash (MLC NAND flash) product under a certain manufacturing process is used as an object for judging the reliability of a flash memory chip. Such as figure 1 As shown, the method includes:

[0049] Step S01, extract the flash memory samples according to the following rules: the sample flash memory must b...

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Abstract

The invention belongs to flash memory chip reliability testing technology, in particular to a method and testing device for judging the reliability of flash memory chip by operating time or current. The present invention first collects the operating time or current of a sample flash memory chip through a test device, then analyzes and processes the data, establishes the corresponding relationship between the data and the reliability of the flash memory chip, and then collects the operating time and current of the flash memory chip to be tested by the test device, and finally Combined with the corresponding relationship of reliability to judge the reliability of the chip to be tested. Compared with the general method, the method for judging the reliability of the flash memory chip proposed in the present invention is not easily disturbed by the value of stored data in the flash memory, and overcomes the shortcoming that the general method cannot effectively prevent the sudden failure of the flash memory and cause data loss.

Description

technical field [0001] The invention relates to the field of reliability testing of flash memory chips, in particular to a method and a testing device for judging the reliability of flash memory chips based on operating time or current. Background technique [0002] With the rapid development of electronic technology, memory, as a carrier for storing data, is increasingly used in electronic systems. Among the memory products, as a non-volatile memory, the flash memory chip has the advantages of high storage capacity and low manufacturing cost. It is the fastest-growing memory product in recent years and gradually occupies a leading position in the non-volatile memory market. [0003] Due to the structural characteristics of the flash memory chip, the medium of the storage unit will have defects as the number of operations increases. These defects will continue to accumulate during use and eventually cause the storage unit to fail, thereby affecting the normal use of the enti...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 潘玉茜李四林
Owner 武汉置富半导体技术有限公司
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