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A method for detecting mutations in industrial agglomeration spatial patterns

A spatial pattern, mutation detection technology, applied in digital data information retrieval, instruments, data processing applications, etc., to achieve the effect of a high degree of quantification and a wide detection range

Active Publication Date: 2021-09-03
HOHAI UNIV
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  • Application Information

AI Technical Summary

Problems solved by technology

However, there are almost no testing and research methods for the sudden change phenomenon in the process of continuous change of industrial spatial structure at home and abroad.

Method used

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  • A method for detecting mutations in industrial agglomeration spatial patterns
  • A method for detecting mutations in industrial agglomeration spatial patterns
  • A method for detecting mutations in industrial agglomeration spatial patterns

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Embodiment Construction

[0079] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0080] Ripley's K function was first used in the analysis of ecological spatial pattern, and then gradually applied to economic geography to study the continuous change process of industrial element location relationship, characteristic agglomeration or other heterogeneous spatial patterns. Therefore, for the acquisition of industrial agglomeration spatial pattern sequence, Ripley's K function is different from other spatial point pattern analysis methods mainly in that it can reflect the spatial pattern of industrial agglomeration at each set spatial scale and realize its spatial heterogeneity. Quantitative research reveals the changing law of industrial agglomeration spatial patterns with spatial scales.

[0081] Since the actual Ripley’s K function value is usually relatively large, and the Ripley’s K function curve h...

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Abstract

The invention relates to a mutation detection method for an industrial agglomeration spatial pattern. First, an industrial geographic space element field is generated, and an industrial geographic and related social and economic database is established; secondly, a spatial point pattern analysis method Ripley's K function is introduced to quantitatively estimate the industrial agglomeration spatial pattern. Ripley's K function value; then use the L function to normalize the Ripley's K function value, and further obtain the marginal L function value sequence of the multi-scale spatial pattern of industrial geography or industrial economic layout; finally, using the Mann-Kendall change point analysis method in mathematical statistics, Through the mutation test of the marginal L function value sequence of the spatial pattern of industrial geography or economic layout, the mutation point and location of the spatial pattern of industrial geography or economic layout are determined. The invention can effectively reveal the spatial spillover effect range of industrial agglomeration while acquiring the changing characteristics of the spatial pattern of industrial agglomeration.

Description

technical field [0001] The invention relates to a method for detecting sudden changes in industrial agglomeration spatial patterns, belonging to the technical field of regional industrial planning. Background technique [0002] As the most prominent geographical feature of economic activities, industrial agglomeration has always been a research hotspot for scholars in urban geography, regional economics and other related fields. According to the theory of new economic geography, the concentration of industrial space will produce economies of scale, showing different spatial patterns of industrial agglomeration, but economies of scale have the characteristics of distance attenuation. A sudden change from a spatial pattern to another spatial pattern. Examining and obtaining the mutation point and mutation location of the spatial pattern of industrial economic layout can quantitatively express the scope of the spatial spillover effect of industrial agglomeration, which will he...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/06G06F16/2458
CPCG06Q10/0637
Inventor 葛莹刘磊鲍倩李均凯
Owner HOHAI UNIV
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