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Mutation detecting method for industrial agglomeration spatial pattern

A technology of spatial pattern and mutation detection, applied in special data processing applications, instruments, electrical digital data processing, etc.

Active Publication Date: 2018-10-12
HOHAI UNIV
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Problems solved by technology

However, there are almost no testing and research methods for the sudden change phenomenon in the process of continuous change of industrial spatial structure at home and abroad.

Method used

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  • Mutation detecting method for industrial agglomeration spatial pattern
  • Mutation detecting method for industrial agglomeration spatial pattern
  • Mutation detecting method for industrial agglomeration spatial pattern

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Embodiment Construction

[0080] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0081] Ripley’s K function was first used in the analysis of ecological spatial pattern, and then gradually applied to economic geography to study the continuous change process of industrial element positional relationship, characteristic agglomeration or other heterogeneous spatial patterns. Therefore, for the acquisition of industrial agglomeration spatial pattern sequence, Ripley's K function is different from other spatial point pattern analysis methods mainly in that it can reflect the spatial pattern of industrial agglomeration at each set spatial scale and realize its spatial heterogeneity. Quantitative research reveals the changing law of industrial agglomeration spatial patterns with spatial scales.

[0082] Since the actual Ripley’s K function value is usually relatively large, and the expressive ability of the...

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Abstract

The invention relates to a mutation detecting method for an industrial agglomeration spatial pattern, comprising: firstly generating an industrial geospatial spatial factor field and establishing an industrial geospatial and related social economic database; secondly introducing a Ripley's K function of the spatial point pattern analysis method to quantitatively estimate the Ripley's K function value of the industrial agglomeration spatial pattern; then using the L function to normalize the Ripley's K function value, and further acquiring the multi-scale spatial pattern marginal L function value sequence of the industrial geospatial or industrial economic layout; and finally determining the spatial pattern mutation point and mutation position of the industrial geospatial or economic layoutby the mutation detection for the spatial pattern marginal L function value sequence of the industrial geospatial or economic layout by using the Mann-Kendall change point analysis method in mathematical statistics. The invention is capable of effectively revealing the range of spatial spillover effects of industrial agglomeration while acquiring the changing characteristics of the industrial agglomeration spatial pattern.

Description

technical field [0001] The invention relates to a method for detecting sudden changes in industrial agglomeration spatial patterns, belonging to the technical field of regional industrial planning. Background technique [0002] As the most prominent geographical feature of economic activities, industrial agglomeration has always been a research hotspot for scholars in urban geography, regional economics and other related fields. According to the theory of new economic geography, the concentration of industrial space will produce economies of scale, showing different spatial patterns of industrial agglomeration, but economies of scale have the characteristics of distance attenuation. A sudden change from a spatial pattern to another spatial pattern. Examining and obtaining the mutation point and mutation location of the spatial pattern of industrial economic layout can quantitatively express the scope of the spatial spillover effect of industrial agglomeration, which will he...

Claims

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Application Information

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IPC IPC(8): G06Q10/06G06F17/30
CPCG06Q10/0637
Inventor 葛莹刘磊鲍倩李均凯
Owner HOHAI UNIV
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