Automatic integrated circuit tester

Abstract

The invention discloses an automatic integrated circuit tester. The tester comprises a fixed base plate, an intelligent transmission mechanism is arranged in the right side of the upper end surface ofthe fixed base plate, a control box is arranged over the intelligent transmission mechanism, a test controller is arranged in the internal right side of the control box, the lower end of an elevatingsleeve penetrates an opening of an elevating groove and is connected with a detection and connection device, the lower end of the left end surface of the control box is fixedly connected with a connection board which extends leftwards, and a recovery box is arranged in a middle position of the upper end surface of the fixed base plate. During work of the tester, the test controller controls running of equipment in the detection process, detection information is collected digitally and displayed via the display panel, data can be observed and stored intelligent in the detection process, interference caused by artificial discrimination and ratification factors in the recording process is avoided, the tester has a high error proofing function, detection, screening and separation are completed in the same device, the cost of the test is reduced, and the working efficiency is increased.

Description

technical field [0001] The invention relates to the field of integrated testing, in particular to an automatic integrated circuit testing device. Background technique [0002] With the development of integrated circuits, more and more functions are expected to be concentrated in a small chip. Performance testing is a very important functional module. The current testing method is generally manual insertion and unplugging. Judging the damage state and recording it. For the interference of human factors, the delivery rate of unqualified products has always been a problem. There are also automatic detection devices on the market, but there is a common problem. The chip is severely worn during the insertion process, which is easy to cause damage to the contact plate. The pins on the device are damaged, which increases the cost, and it is also easy to cause a large amount of economic losses due to misjudgment of the device. Contents of the invention [0003] The object of the ...

AI Technical Summary

Problems solved by technology

[0002] With the development of integrated circuits, more and more functions are expected to be concentrated in a small chip. Performance testing is a very important functional module. The current testing method is generally manual plugging and unplugging. Judging the damage state and recording it. For the interference of human factors, the delivery rate of unqualified products has always been a problem. There are also automatic detection devices on the market, but there is a common problem. The chip is severely worn during insertion, which is easy to cause damage to the contact plate. The pins on the device are damaged, which increases the cost, and it is also easy to cause a lot of economic losses due to misjudgment of the device

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