Testability analysis method and device for electronic equipment

Abstract

The invention provides a testability analysis method and device for electronic equipment. The method includes determining multiple functions to be achieved by to-be-built electronic equipment; determining information flow relations between the multiple functions; determining multiple hardware parts required to achieve the multiple functions and building a hardware part set; determining the information flow relations between the multiple hardware parts according to the information flow relations between the multiple functions; building a multi-signal flow graph model of the hardware part set according to the information flow relations between the multiple hardware parts; determining the testability index of the hardware part set according to the multi-signal flow graph model of the hardwarepart set; and analyzing whether the testability index of the hardware part set accords with electronic equipment building conditions. Through the information flow analysis on functional levels, the establishment of the testability information flow model at hardware levels can be reduced. The state of testability can be known in the functional level and assistance is provided for system staff in consideration on testability, the difficulty of testability works can be reduced, and popularization can be achieved easily.

Description

technical field [0001] The invention relates to the technical field of electronic equipment design, in particular to a testability analysis method and device for electronic equipment. Background technique [0002] Testability (Testability, also translated as testability) is a design feature that a product can accurately determine its state (workable, non-workable, performance degradation) in a timely manner and isolate its internal faults. In the prior art, the testability analysis of the designed products is generally carried out, thereby reducing the use and maintenance costs. For example, according to the investigation of the US Navy, F / A-18, F-14, A-16E and S-3A Technological improvements in testability for 239 key components of four major Navy aircraft reduced their operating and maintenance costs by 30 percent. The above describes the testability analysis of the key components of the aircraft after the design of the aircraft to reduce the cost of use and maintenance. ...

AI Technical Summary

Problems solved by technology

Testability modeling and analysis based on multi-signal flow between products makes the testability work more difficult and difficult to promote

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