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Early failure rate change-point recognition method based on monitoring Weibull shape parameter

A technology of early failure rate and shape parameters, applied in the field of quality management, can solve the problems of ignoring the early failure rate change point analysis and utilization

Inactive Publication Date: 2018-07-20
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, studies on early failure based on reliability tests or using failure data are mostly used for failure rate modeling and rarely focus on early failure rate change points, and ignore an important difference between the early failure stage and the accidental failure stage of the product. Distinguished by the difference of Weibull shape parameters, thus ignoring the analysis and utilization of the critical moment of early failure rate change point

Method used

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  • Early failure rate change-point recognition method based on monitoring Weibull shape parameter
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  • Early failure rate change-point recognition method based on monitoring Weibull shape parameter

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Embodiment Construction

[0071] The present invention will be further described in detail below with reference to the drawings and examples.

[0072] The present invention is an early failure rate change point identification method based on monitoring Weibull shape parameters. See the specific steps figure 1 As shown, the implementation steps are as follows:

[0073] Step 1 Extract the early life test data of the product from the basic database related to the early failure of the product for subsequent key analysis. In this example, in order to collect the quality information of a certain electromechanical product, a burn-in test is carried out for a certain batch of products that have just been manufactured, and the product life information is recorded. See Table 1 below.

[0074] Table 1. Product life data

[0075]

[0076] Step 2 combines the general failure rules of the product, and establishes the early failure rate change point model for the early stage failure rate with time.

[0077] The product failur...

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Abstract

The invention provides an early failure rate change-point recognition method based on monitoring Weibull shape parameters. The method comprises: step one, establishing a related early failure basic database; step two, establishing an early failure rate change point model of a product; step three, establishing an early failure rate change-point monitoring index; step four, determining relevant design parameters of a CUSUM control chart for identifying the early failure rate change point; step five, drawing a control chart; step six, identifying an early failure rate change point; and step seven, carrying out a result analysis. Therefore, an objective of identifying the early failure change point of the product is achieved; a support basis is provided for making an in-plant life test plan for an enterprise and determining an after-sales quality assurance policy; and thus the product quality and the production efficiency of the enterprise are improved.

Description

Technical field [0001] The invention provides an early failure rate change point identification method based on monitoring Weibull shape parameters, which belongs to the field of quality management. Background technique [0002] Early product failure will have a strong negative impact on customer satisfaction, and at the same time will significantly increase the cost of after-sales warranty service. In the increasingly fierce market competition environment, due to cost and time constraints, there are potential defects that cannot be detected in production, which reduces the reliability of products after batch production, which is manifested by higher early failure rates and various types of early use stages. Early failures have caused serious consequences such as casualties, environmental pollution problems, customer loss, warranty claims, emergency resource mobilization costs, insurance costs and other serious consequences. [0003] Statistically, an important rule of product fai...

Claims

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Application Information

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IPC IPC(8): G06Q10/06
CPCG06Q10/06395
Inventor 何益海魏轶朱春灵
Owner BEIHANG UNIV
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