Digital Waveform Test Method of Integrated Circuit Tester

Abstract

The invention discloses a digital waveform testing system and digital waveform generating method of an integrated circuit tester. The method comprises reading and sending a data generating command toa driving chip; setting the bit widths N and depths of FIFOs in a vector waveform generating module and a switch information generating module according to a set transmitter rate and a transmitter bitwidth; causing the set rate Rate to determine the resolution of the waveform data and the switch data as 1 / Rate, causing the data of an N-bit width to represent the data in a N / Rate time length, reading a cycle T and edge positioning information D1 and D2, dividing data in one cycle into T*Rate / N pieces of data to be successively saved in the waveform data; setting the transmitter rate and bit width to be the same, reading the cycle and the edge positioning information D0 and D3, dividing the switch information in one cycle into T*Rate / N d pieces of data to be successively stored in the switch data; while data is written into the FIFO, reading the waveform data and the switch data according to pipeline operation, and sending drive data through the transmitter.

Description

technical field [0001] The invention relates to a digital waveform testing method for an integrated circuit tester, belonging to the field of digital integrated circuit testers. Background technique [0002] Digital integrated circuit tester is a special instrument for testing integrated circuits. It tests DUT function, DUT DC parameters and AC parameters by sending vector test waveforms. It mainly relies on ASIC or programmable logic devices + peripheral high-precision devices to generate waveforms with a precision of 100 ps or even higher precision to measure various indicators of the DUT; the usual methods are either long development time and high cost, or the device takes up too much Large size and high power consumption. Contents of the invention [0003] In view of the above problems, the present invention provides a digital waveform testing method of an integrated circuit tester with short development time, low cost, small occupied volume and low power consumption....

AI Technical Summary

Problems solved by technology

It mainly relies on ASIC or programmable logic devices + peripheral high-precision devices to generate waveforms with a precision of 100 ps or even higher precision to measure various indicators of the DUT; the usual methods are either long development time and high cost, or the device takes up too much Large size and high power consumption

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