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A sample conveying system applied to a vacuum interconnection system

A sample transmission and interconnection system technology, applied in the field of sample transmission system, can solve problems such as simple mechanical movement

Active Publication Date: 2021-06-22
SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] For the above-mentioned vacuum interconnection system, it is necessary to solve the problem of exchanging the sample parking platform of each equipment on the vacuum pipeline with the sample exchange platform of the sample transfer trolley in the vacuum interconnection pipeline. Individual samples need to be turned upside down, but it cannot affect the vacuum degree, cleanliness, and locality of the entire system. The basic solution to the problem of high-temperature working conditions and space size is to use purely mechanical movement, and not use any electric servo or pneumatic servo in vacuum to meet the vacuum degree, cleanliness, local high temperature and space size of the vacuum interconnection system.

Method used

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  • A sample conveying system applied to a vacuum interconnection system
  • A sample conveying system applied to a vacuum interconnection system
  • A sample conveying system applied to a vacuum interconnection system

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Embodiment Construction

[0020] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0021] ginseng figure 1 with figure 2 , a sample transfer system applied to a vacuum interconnection system, the sample transfer system includes a vacuum pipeline 1; at least two sample holders 5, 4 and two vacuum lifting platforms 11 corresponding to the at least two sample holders 5, 4 , 12; at least one fully mechanically driven manipulator 9, which is at least used for transferring the sample 6 between the sample holder 5 and the sample holder 4, and driving the upper and lower sides of the sample 6; at least one sample manipulator 7, The sample manipulator 7 is at least used to take the sample 6 in the sample holder 5 to the corresponding equipment; at least two vacuum magnetic rods 10 and 8 are used to drive the fully mechanically driven manipulator 9 and the sample manipulator 7 respectively.

[0022] Further, the sample man...

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Abstract

The invention discloses a sample transmission system applied to a vacuum interconnection system, which includes a vacuum pipeline; at least two sample holders and two vacuum lifting platforms corresponding to the at least two sample holders; at least one fully mechanically driven manipulator, the fully mechanically The driving manipulator is at least used to transfer the sample between the sample holder and the sample holder, and to drive the upper and lower sides of the sample; at least one sample manipulator is used to at least take the sample in the sample holder to the corresponding device; at least two Two vacuum magnetic rods are used to drive the fully mechanically driven manipulator and the spoon-shaped sample manipulator respectively. The full mechanical movement in the vacuum is used to realize the transfer of the sample from one sample holder to another sample holder or equipment, as well as the flipping of the upper and lower sides of the sample. The sample transfer process is not driven by electric or pneumatic servo in the vacuum, and the vacuum degree of the whole system is not affected. , cleanliness, and can adapt to the local high temperature working conditions and space dimensions in the vacuum interconnection system.

Description

technical field [0001] The invention relates to the field of vacuum machinery, in particular to a sample transmission system applied to a vacuum interconnection system. Background technique [0002] Since the artificial vacuum on the earth can achieve a local ultra-clean environment, it is of great significance to the growth, preparation and scientific research of specific materials, such as semiconductor wafer growth, semiconductor device preparation, electron scanning microscope detection of objects, transmission electron microscope The detection of the interface of the material, etc., is carried out in an artificial vacuum environment. In order to make better use of the high-cleanliness characteristics of the vacuum to continuously study material growth, device preparation, and performance testing, the above-mentioned process can be completed by using the vacuum interconnection system, so that the research sample itself does not have to be exposed to Introduce pollution ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B25J11/00B25J15/12
CPCB25J11/0095B25J15/12
Inventor 卢荻丁孙安丁祥金黄增立陆晓鸣阮颖华丁祥飞
Owner SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI
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