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Data-driven module, its failure detection method, and display device

A technology for driving modules and detection methods, applied to static indicators, instruments, etc., can solve problems such as failure analysis of unfavorable display substrates

Inactive Publication Date: 2021-05-18
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, considering the volume of the display substrate, the test substrate will be cut and discarded in the subsequent cutting (Cell Cutting) process, but this is not conducive to the failure analysis of the display substrate after manufacture

Method used

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  • Data-driven module, its failure detection method, and display device
  • Data-driven module, its failure detection method, and display device
  • Data-driven module, its failure detection method, and display device

Examples

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Embodiment Construction

[0039] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present invention. Rather, they are merely examples of apparatuses and methods consistent with aspects of the invention as recited in the appended claims.

[0040] An embodiment of the present invention provides a data driving module, which may include a data driving chip, a driving power supply and related components. figure 1 It is a schematic diagram showing the principle of a data driving chip in a data driving module according to an embodiment of the present invention. see figure 1 , the data driver chip includes common field effect transisto...

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Abstract

The invention relates to a data drive module, a failure detection method thereof, and a display device. The module includes a data drive chip; a spare field effect transistor group is arranged in the data drive chip; the spare field effect transistor group is connected to multiple input terminals and multiple output terminals of the data drive chip to form a preset circuit ; The spare field effect tube group is used to turn on when receiving the detection control signal, and turn on the corresponding input terminal and output terminal of the detection control signal; the detection control signal is to control each spare in the spare field effect tube group The external voltage signal for turning on or off the FET. It can be seen that this embodiment can detect the failure of the data driving chip and the display substrate based on the spare field effect transistor group in the data driving chip, which will not increase the size of the data driving chip and will not affect the wiring density of the display substrate.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a data drive module, a failure detection method thereof, and a display device. Background technique [0002] At present, in the process of manufacturing display substrates, due to problems such as inherent defects of pixel circuits and process fluctuations, the yield rate of display substrates is low. In order to improve the yield rate, it is necessary to perform failure analysis (FA) on the display substrate. In the related art, the failure analysis is realized based on the terminal voltage of the data-driven module (Driver IC), and the terminal voltage of the data-driven module is read through the test substrate (Test Panel) arranged on the edge of the display substrate, and the failure is analyzed based on the above-mentioned terminal voltage reason. However, considering the volume of the display substrate, the test substrate will be cut and discarded in the subsequent cutt...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00G09G3/20
CPCG09G3/006G09G3/20
Inventor 张昌
Owner BOE TECH GRP CO LTD
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