Computer keyboard service life test device

Abstract

A computer keyboard service life test device disclosed by the present invention comprises a pedestal and a test machine fixedly installed in the pedestal, a first concave connection groove is arrangedin the undersurface of the test machine, and the top wall in the first concave connection grooved is intercommunicated with a second concave connection groove extending upwards. A sliding block is inslip fit in the first concave connection groove, a push block which extends in the second concave connection groove and is in slip fit is fixedly arranged at the top of the sliding block, and the left and right sides of the push block are equipped with the first slope surfaces correspondingly. A protruding column is fixedly arranged in the top wall of the second concave connection groove relativeto the top of the push block, a third concave connection groove is arranged in the undersurface of the sliding block, and the left and right sides of the third concave connection groove are correspondingly equipped with the adapting fit concave connection grooves extending front and back. A knocking member extending front and back is in adapting fit in each adapting fit concave connection groove,and a beating device is in power fit connection in the third concave connection groove. The computer keyboard service life test device of the present invention is simple in structure, is convenient to operate, and enables the working efficiency of the keyboard strength test to be improved.

Description

technical field [0001] The invention relates to the field of computers, in particular to a computer keyboard service life testing device. Background technique [0002] A good computer keyboard needs to have a long service life. When a new keyboard product is developed, it is necessary to perform a knock test on the keyboard keys, and perform hundreds of thousands of uninterrupted knocks on the keys. The key life span currently on the market The price of the tester is very expensive, and the structure is complex, and daily maintenance and repair are difficult. The existing test method is expensive and difficult to be widely accepted. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a computer keyboard service life testing device, which can solve the above-mentioned problems in the prior art. [0004] The present invention is achieved through the following technical solutions: a computer keyboard service life testi...

AI Technical Summary

Problems solved by technology

[0002] A good computer keyboard needs to have a long service life. When a new keyboard product is developed, it is necessary to perform a knock test on the keyboard keys, and perform hundreds of thousands of uninterrupted knocks on the keys. The key life span currently on the market The price of the tester is very expensive, and the structure is complex, and daily maintenance and repair are difficult. The existing test methods are expensive and difficult to be widely accepted.

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