A parameter recalibration method and equipment for a structured light three-dimensional measurement system
A technology of three-dimensional measurement and calibration method, which is applied in the field of computer vision, can solve the problems of immaturity and low measurement accuracy, achieve the effect of improving the absolute spatial position and relative accuracy, and improving the accuracy of three-dimensional calibration
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[0032] The invention relates to a method for recalibrating internal parameters of a projector of a structured light three-dimensional measurement system, which is specifically aimed at a measurement system with one camera and one projector, and improves the calibration accuracy of the system. Specifically, an auxiliary camera is added to the original system, a high-precision white plate (calibration plate) is placed, the projector projects a structured light pattern, and the original system camera and the auxiliary camera collect the white plate pattern. Firstly, the dual cameras are calibrated to obtain the parameters of the auxiliary camera; secondly, the white plate is reconstructed based on the principle of stereo vision by using the photographs taken, and then the reconstructed point cloud is back-projected onto the emitting phase surface of the projector, and the corresponding projection phase is calculated, and compared with The actual phase difference is obtained to obt...
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