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A parameter recalibration method and equipment for a structured light three-dimensional measurement system

A technology of three-dimensional measurement and calibration method, which is applied in the field of computer vision, can solve the problems of immaturity and low measurement accuracy, achieve the effect of improving the absolute spatial position and relative accuracy, and improving the accuracy of three-dimensional calibration

Active Publication Date: 2019-01-22
SOUTHEAST UNIV
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Problems solved by technology

At present, the calibration of projectors is still immature, and the parameter error of the projector obtained by the above method is often several times that of the camera parameter error. The main reason for the low measurement accuracy of the system

Method used

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  • A parameter recalibration method and equipment for a structured light three-dimensional measurement system

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Embodiment Construction

[0032] The invention relates to a method for recalibrating internal parameters of a projector of a structured light three-dimensional measurement system, which is specifically aimed at a measurement system with one camera and one projector, and improves the calibration accuracy of the system. Specifically, an auxiliary camera is added to the original system, a high-precision white plate (calibration plate) is placed, the projector projects a structured light pattern, and the original system camera and the auxiliary camera collect the white plate pattern. Firstly, the dual cameras are calibrated to obtain the parameters of the auxiliary camera; secondly, the white plate is reconstructed based on the principle of stereo vision by using the photographs taken, and then the reconstructed point cloud is back-projected onto the emitting phase surface of the projector, and the corresponding projection phase is calculated, and compared with The actual phase difference is obtained to obt...

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Abstract

The invention relates to a parameter re-calibration method for a structured light three-dimensional measurement system, and equipment; and an auxiliary camera is added in a system with a camera and a projector to realize re calibration on a parameter inside the projector. A high-precision white flat plate is arranged; the projector projects a structured light pattern; and the original system camera and the auxiliary camera collect a white flat plate pattern. The two cameras are calibrated to obtain the parameter of the auxiliary camera; on the basis of a stereoscopic vision principle, a white flat plate is reconstructed by using a shot picture; a reconstructed point cloud is projected to an emission phase plane of the projector in a back projection mode, a corresponding projection phase is calculated, and a difference between the calculated projection phase and an actual phase to obtain a phase residual difference value; and then on the basis of a principle of least squares, calculation is carried out to obtain error values of a transverse equivalent focal distance and a lateral optical center of the projector, thereby completing re calibration of the parameter inside the projector. Therefore, the calibration accuracy of the structured light three-dimensional measurement system is improved.

Description

technical field [0001] The invention relates to a method and equipment for recalibrating internal parameters of a projector in a structured light three-dimensional measurement system, and belongs to the technical field of computer vision. Background technique [0002] Structured light three-dimensional measurement system is an important three-dimensional measurement system in the field of computer vision, which has the characteristics of fast, easy assembly and high precision. The accuracy of the system parameters directly determines the measurement accuracy of the system. [0003] The parameters of the structured light 3D measurement system are obtained through calibration, and the quality of the calibration method directly determines the accuracy of the obtained system parameters. The current calibration of the system mainly includes two parts, camera calibration and projector calibration. The research on camera calibration has a long history. The classic methods include...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
CPCG01B11/2433
Inventor 周平于云雷何思渊蔡国超
Owner SOUTHEAST UNIV
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