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Method and device for testing storage

A memory and self-test technology, applied in the field of memory, can solve the problems of rising cost of memory products and high test cost

Active Publication Date: 2017-10-31
GIGADEVICE SEMICON (BEIJING) INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the above problems, the purpose of the embodiments of the present invention is to provide a method for testing memory and a device for testing memory, so as to solve the problem that the existing burn-in test method has a high test cost and causes the cost of memory products to rise

Method used

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  • Method and device for testing storage

Examples

Experimental program
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Effect test

Embodiment 1

[0028] refer to figure 2 , shows a flow chart of steps of an embodiment of a method for testing a memory of the present invention, the memory includes a self-test controller, and the self-test controller may be embedded or integrated in the memory, and the method for testing the memory may specifically include the following steps:

[0029] S21. Connect the memory to the first test device, and send an instruction to start the self-test to the memory through the first test device.

[0030] Wherein, the memory may be any memory, including a memory whose stored information will not disappear when the system is turned off or has no power supply, and a memory whose stored information will disappear. Specifically, the memory and the first test device may be connected through a data interface, and the first test device may supply power to the memory. After the memory receives the command to start the self-test, the self-test controller is started.

[0031] Specifically, the command...

Embodiment 2

[0045] refer to image 3 , shows a flow chart of the steps of another method embodiment for testing the memory of the present invention, the memory includes a self-test controller, the self-test controller can be embedded or integrated in the memory, and the information and presets corresponding to each function to be tested The information corresponding to the maximum number of tests is integrated in the startup self-test instruction, and the method for testing the memory may specifically include the following steps:

[0046] S31, setting the information corresponding to each function to be tested and the information corresponding to the preset maximum number of tests in the start self-test instruction.

[0047] Wherein, the memory may be any memory, including a memory whose stored information will not disappear when the system is turned off or has no power supply, and a memory whose stored information will disappear. Specifically, in step S31, information corresponding to e...

Embodiment 3

[0066] refer to Figure 4 , shows a structural block diagram of an embodiment of a device for testing a memory of the present invention, the memory includes a self-test controller, and the self-test controller can be embedded or integrated in the memory, and the device for testing the memory may specifically include the following modules:

[0067] The command sending module 41 is configured to connect the memory with the first test device, and send the start-up self-test command to the memory through the first test device.

[0068] Wherein, the memory may be any memory, including a memory whose stored information will not disappear when the system is turned off or has no power supply, and a memory whose stored information will disappear. Specifically, the memory and the first test device may be connected through a data interface, and the first test device may supply power to the memory. After the memory receives the command to start the self-test, the self-test controller is ...

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Abstract

The embodiment of the invention provides a method and a device for testing storage. The storage comprises a self-testing controller. The method comprises the following steps: connecting the storage with a first testing device and sending a self-test starting instruction to the storage by the first testing device; confirming various to-be-tested functions of the storage by the self-testing controller and circularly testing the storage according to the to-be-tested functions till the circular times are equal to the preset maximal test times; connecting the storage with a second testing device, testing all the functions of the storage by the second testing device and confirming that the storage fails if any function fails to pass the test. According to the embodiment of the invention, the ageing test process is simplified, the convenience in ageing test and the output efficiency of the bath production of the storage are promoted, the requirement of the ageing test for the test equipment is greatly reduced and the ageing test cost of the product is lowered.

Description

technical field [0001] The invention relates to the technical field of memory, in particular to a method for testing memory and a device for testing memory. Background technique [0002] Due to the large capacity and high device density of the memory, there is a serious problem of early failure, and this problem is exacerbated as the size of the memory technology shrinks. The relationship between the failure probability of the memory and the number of uses is consistent with figure 1 The characteristic of the bathtub curve shown is that the failure probability of the memory is high at the beginning of use, and the failure probability of the memory will be greatly reduced after a certain number of uses, until the service life of the memory is reached, the failure probability of the memory will continue to increase. The reliability of the memory can be improved through the burn-in test. Aging test is to repeatedly erase, write, read and other operations on the memory before ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/50
CPCG11C29/50
Inventor 胡洪
Owner GIGADEVICE SEMICON (BEIJING) INC
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