Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Efficiently-debugged U-type cavity laser and debugging method thereof

A debugging method and laser technology, applied to lasers, laser components, phonon exciters, etc., can solve the problems of tedious, difficult and low-efficiency laser debugging, achieve efficient debugging, ensure end-face parallelism, and simple debugging methods Effect

Pending Publication Date: 2017-09-29
NANJING INST OF ADVANCED LASER TECH
View PDF7 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Purpose of the invention: The invention provides a U-shaped cavity laser that can be debugged efficiently and its debugging method, aiming to solve the problems of cumbersome, difficult and low-efficiency laser debugging

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Efficiently-debugged U-type cavity laser and debugging method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings;

[0019] Such as figure 1 As shown, the U-shaped cavity laser that can be efficiently debugged according to the present invention includes a resonator, a laser debugging device, a laser crystal 9 in the resonator, a pump source 16 symmetrically arranged at both ends of the resonator; 21 and an optical coupling system 18; 19, the pump light emitted by the pump source 16; 21 passes through the center of the laser crystal 9 after being collimated and focused by the optical coupling system 18; 19. The pump source 16; 21 is preferably a laser diode. The pumping source 16; 21 is connected to the optical coupling system 18; 19 through an optical fiber 17; 20.

[0020] The resonant cavity includes a total reflection mirror 14, two reflectors 7; 11, an output mirror 4, a total reflection mirror 14, two reflectors 7; a U-shaped folding cavity formed by 11 and an...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an efficiently-debugged U-type cavity laser and a debugging method thereof. A 1064nm infrared laser, a PBS and a quarter-wave plate are used to form a laser debugging device, 1064nm laser is adjusted to be reference light, pairs of apertures are used to adjust the reference light to be collimated; pairs of apertures are then used to adjust a reflection light path to be collimated, and a laser crystal is adjusted to enable the end surface of the laser crystal to be vertical to the reference light; a laser diode and an optical coupling system are adjusted to enable pumping light and the reference light to be overlapped; a total-reflection mirror is adjusted to enable reflection light of the reference light through the PBS and reflection light through the total-reflection mirror to be overlapped; and an output mirror is adjusted to enable the reflection light of the total-reflection mirror and reflection light through the output mirror to be overlapped. The laser debugging device is used for enabling the pumping light and the reference light to be overlapped, reference light reflected by the total-reflection mirror and the output mirror is overlapped, the end surface parallelism of the whole resonant cavity is ensured, the laser U-type cavity can be debugged efficiently, and the debugging method is simple and accurate.

Description

technical field [0001] The invention relates to the debugging field of solid-state laser technology, in particular to a U-shaped cavity laser capable of high-efficiency debugging and a debugging method thereof. Background technique [0002] Resonant cavity, working medium and pumping source are the three necessary conditions for laser generation. Laser resonant cavity is mainly composed of total reflection mirror, output mirror and working medium. The laser U-shaped cavity inserts some reflectors in the cavity to turn back the optical path, so that the length of the cavity can be increased and the volume of the resonant cavity can be controlled at the same time, which can make better use of the internal space of the laser. However, there are many optical components in the U-shaped cavity, and the deviation of the optical components will affect the optical path of the resonant cavity and seriously affect the parameters of the laser output. Existing laser debugging is cumbers...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01S3/081
CPCH01S3/081H01S3/0815
Inventor 王延成周军于广礼任树青吴佳滨
Owner NANJING INST OF ADVANCED LASER TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com