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Method for testing damaged point of non-conductive layer on surface of metal part

A test method and technology of metal parts, applied in the direction of material electrochemical variables, etc., can solve the problems of inability to monitor the quality fluctuation of the production process in time, low efficiency, and time-consuming detection methods, and achieve the effect of simple, quick and timely adjustment of the test method

Inactive Publication Date: 2017-08-11
AAC TECH PTE LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In the process of producing and preparing the non-conductive layer, it is necessary to detect the quality of the non-conductive layer on the surface in time to control its quality. At present, the non-conductive layer on the surface needs to pass the environmental reliability before detecting the damaged point or the weak point. The detection method is time-consuming and inefficient. Therefore, it is impossible to monitor the quality fluctuations in the production process in time to achieve timely adjustments

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  • Method for testing damaged point of non-conductive layer on surface of metal part

Examples

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Effect test

Embodiment 1

[0038] Electrolyte solution: sodium chloride solution containing phenolphthalein, wherein the mass composition of the electrolyte solution is: water: phenolphthalein reagent: sodium chloride=900:20:1. And the phenolphthalein reagent is obtained by dissolving 8 g of phenolphthalein into 500 mL of ethanol solution.

[0039] Test steps: break sample 1 to form a hole point, then immerse sample 1 in the electrolyte solution, connect the anode of the electrolysis device to the positive pole of the power supply, connect the cathode of the electrolysis device to the negative pole of the power supply, and then connect the anode to the broken The hole point is connected, the cathode is connected to the electrolyte solution, the power is turned on, and the power is set to 24V DC power supply, the test is started, and the red area and quantity of the sample are observed after 30 seconds. It can be seen that after 30 seconds, red color has appeared on the surface of sample 1, so the tester...

Embodiment 2

[0041] Electrolyte solution: sodium chloride solution containing phenolphthalein, wherein the mass ratio of water, phenolphthalein reagent and sodium chloride in the electrolyte solution is 1000:30:2. And the phenolphthalein reagent is obtained by dissolving 8 g of phenolphthalein into 500 mL of ethanol solution.

[0042] Test steps: perforate sample 2 to form a hole point, then immerse sample 2 in the electrolyte solution, connect the anode of the electrolysis device to the positive pole of the power supply, connect the cathode of the electrolysis device to the negative pole of the power supply, and then connect the anode to the sample The hole point is connected, the cathode is connected to the electrolyte solution, the power is turned on, and the power is set to 12V DC power supply, and the red area and quantity of the sample shell are observed after 10 seconds of starting the test. The red area on the surface of sample 2 can be observed after 10 seconds using the dielectri...

Embodiment 3

[0044]Electrolyte solution: sodium chloride solution containing phenolphthalein, wherein the mass ratio of water, phenolphthalein reagent and sodium chloride in the electrolyte solution is 1100:40:3. And the phenolphthalein reagent is obtained by dissolving 8 g of phenolphthalein into 500 mL of ethanol solution.

[0045] Test steps: Break holes in sample 3 to form holes, then immerse sample 3 in the electrolyte solution, connect the anode of the electrolysis device to the positive pole of the power supply, connect the cathode of the electrolysis device to the negative pole of the power supply, and then connect the anode to the sample The hole point is connected, the cathode is connected to the electrolyte solution, the power is turned on, and the power is set to a 12V DC power supply, and the test is started. After 20s, observe the red area and quantity of the sample shell. It can be seen that after 20 seconds, red color has appeared on the surface of sample 3, so the tester c...

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Abstract

The invention provides a method for testing a damaged point of a non-conductive layer on the surface of a metal part. The method comprises the following steps: material supply: the metal part provided with the non-conductive layer on the surface is provided, and an electrolysis device and an electrolyte solution are provided; construction of an electrolysis system: a hole is formed in the metal part, the metal part is immersed into the electrolyte solution after a hole point is formed, an anode is connected with the hole point of the metal part, a cathode makes contact with the electrolyte solution, and the electrolysis system is constructed; testing: a power supply is started to electrify the electrolysis system, and the damaged point of the non-conductive layer on the surface of the metal part is determined by checking the color change condition of the electrolyte solution on the surface of the metal part. The method for testing the damaged point of the non-conductive layer on the surface of the metal part is simple and rapid.

Description

[0001] 【Technical field】 [0002] The invention relates to the field of surface treatment of metal parts, in particular to a method for testing damage points of non-conductive layers on the surface of metal parts. [0003] 【Background technique】 [0004] In today's smart devices, metal parts are more and more widely used because of their good physical properties and beautiful appearance. In order to make the color of the shell of the smart device more popular with consumers or to make the metal parts of the smart device last longer, it is necessary to form a non-conductive layer on the surface of the metal part, such as an anodized layer, to achieve the surface coloring of the metal part. And improve the corrosion resistance, wear resistance and hardness of metal parts. [0005] In the process of producing and preparing the non-conductive layer, it is necessary to detect the quality of the non-conductive layer on the surface in time to control its quality. At present, the non-...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/26
CPCG01N27/26
Inventor 刘霞
Owner AAC TECH PTE LTD
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