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A test method for cmos sensor

A technology of CMOS sensor and test method, which is applied in the direction of TV, electrical components, image communication, etc., can solve the problems of CMOS sensor circuit and pixel performance single, less test function, less test quantity, etc., to reduce cost, increase functionality, The effect of improving the convenience of testing

Active Publication Date: 2021-06-22
国芯微(重庆)科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Existing test systems usually can only test the circuit and pixel performance of CMOS sensors, and can only test one CMOS sensor chip
It has the technical problems of few test functions and a small number of tests

Method used

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  • A test method for cmos sensor
  • A test method for cmos sensor
  • A test method for cmos sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0056] This embodiment provides a test system for CMOS sensors, such as figure 1 , the test system includes a parallel light light box that provides parallel light, the parallel light light box is a DNP light box; the number is 3 lensless CMOS sensors, and the lensless CMOS sensor corresponds to the position of the parallel light during testing; Describe the test board that no lens CMOS sensor is connected, described test board includes the image sensor that is used to collect signal data; Described no lens CMOS sensor and test board are all fixed on test board holder, and described test board holder is fixedly connected to Lifting platform; the test board is connected to the control unit through USB2.0, the control unit is also connected to the lifting platform, and the control unit is connected to the upper computer through a USB cable and serial port; the upper computer is located in the sealed Outside the light box, the rest of the test system is placed in a sealed dark box...

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Abstract

The invention relates to a testing method for CMOS sensors, which mainly solves the technical problems of few testing functions and a small number of testing chips in the prior art. The invention adopts a parallel light box and N lensless CMOS sensors Corresponding to the position of the parallel light when the lensless CMOS sensor is tested; the test board connected to the lensless CMOS sensor, the test board includes an image sensor for collecting signal data; the lensless CMOS sensor and the test board are fixed on the test board The test board fixed board is fixedly connected to the lift table; the test board is connected to the control unit through USB2.0, the control unit is also connected to the lift table, and the control unit is connected to the host computer through a USB cable and a serial port The technical scheme of connection can better solve this problem and can be used in the performance test of CMOS sensor.

Description

technical field [0001] The invention relates to the field of sensor testing, in particular to a testing method for CMOS sensors. Background technique [0002] CMOS sensors made with a new process generally need to evaluate the circuit and pixel performance for subsequent mass production with this process. Since it is necessary to evaluate and test the circuit and pixel performance, it is necessary to collect data, and then convert the data to obtain the desired data. Evaluating circuit and pixel performance is a very important link. The number of test chips is relatively large, maybe dozens or even hundreds, and each chip needs to capture many pictures for analysis. The workload is still relatively large. The conditions for each test To be consistent, the test environment needs to be placed in a sealed light box, and the data is collected and calculated through the control system. [0003] Existing test systems usually can only test the circuit and pixel performance of a C...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 不公告发明人
Owner 国芯微(重庆)科技有限公司
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