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Electromagnetic acceleration enhanced plasma detection system

A detection system and plasma technology, applied in the field of detection systems, can solve the problems of increased difficulty in detection and insufficient detection limit, and achieve the effect of low effective utilization

Inactive Publication Date: 2017-05-31
TOPLUMEN LASER TECH BEIJING CO LTD
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  • Summary
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, there are certain problems in traditional plasma detection, for example, the detection limit is not low enough, resulting in the minimum detection limit of many elements being higher than the national standard value, which makes it more difficult for the comprehensive promotion of plasma detection to food safety and environmental detection

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Embodiment Construction

[0023] In order to further understand the features, technical means, and achieved specific objectives and functions of the present invention, and to analyze the advantages and spirit of the present invention, the present invention will be further described through the following examples.

[0024] The invention proposes a design scheme of a plasma detection system, and provides a method for lower element content in detection substances.

[0025] The structural diagram of the example of the present invention is referring to attached figure 1 .

[0026] The invention patent is mainly composed of seven parts: light source module (1), electromagnetic acceleration module (2), sample module (3), control module (4), detection module (5), logic module (6) and display module (7) .

[0027] In this patent, the centering light source module (1) and the detection module (5) realize the time-sharing control and cooperation through the control module (4) to complete the corresponding funct...

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Abstract

The invention discloses an electromagnetic acceleration enhanced plasma detection system which combines electromagnetic acceleration with a laser plasma excitation detection technique. The electromagnetic acceleration enhanced plasma detection system provided by the invention is a system capable of completing material element and component content detection. The detection system mainly comprises a light source module, an electromagnetic acceleration module, a sample module, a control module, a probing module, a logic module and a display module; the logic module is connected with the control module, the probing module and the display module; the control module realizes the control on the light source module, the electromagnetic acceleration module and the probing module; light emitted from the light source module irradiates a to-be-detected object on the sample module and induces plasma, the plasma enters the probing module under the action of the electromagnetic acceleration module, and the detection collects sample module information and transfers the sample module information to the logic module. The electromagnetic acceleration enhanced plasma detection system provided by the invention has better probing precision and lower detection limit, and realizes zero pretreatment on a to-be-detected sample.

Description

technical field [0001] The invention belongs to a detection system, in particular to a detection system which realizes enhanced plasma detection through electromagnetic acceleration. Background technique [0002] Plasma detection, which is a kind of spectral detection technology that has gradually emerged in recent years by measuring the induced plasma spectrum on the surface of a substance, is a kind of atomic emission spectroscopy. Plasma technology is so far the only known technique capable of detecting spectra of all elements in any environment; also in various sample forms in solid, liquid, powder, gas form. At the same time, the plasma detection technology has many advantages such as fast measurement speed, remote non-contact measurement, and simple system structure. Based on the many advantages and versatility of plasma detection technology, some people call it a "universal" detection technology. [0003] At the same time, it cannot analyze multiple elements at the ...

Claims

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Application Information

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IPC IPC(8): G01N21/63
Inventor 不公告发明人
Owner TOPLUMEN LASER TECH BEIJING CO LTD
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