Method for measuring both reflectivity of high-reflection optical element and transmittance of high-transmission optical element based on cavity ring-down technology
A ring-down technology for optical components and optical cavities, which is applied in the direction of transmittance measurement and scattering characteristic measurement, can solve the problems of measurement accuracy influence, complicated device, and inability to guarantee the position of the same component, and achieve the effect of reducing costs
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] Combine below figure 1 and figure 2 The measurement system in which the initial optical cavity is a folded cavity describes a method for simultaneously measuring the reflectivity and transmittance of a high reflection / high transmission optical element based on the optical cavity ring-down technology of the present invention.
[0031]The light source 1 is a continuous semiconductor laser, and the function generator card 11 is used for square wave modulation output; according to the optical feedback optical cavity ring down technology, the laser is injected into a stable optical resonant cavity. A stable initial optical cavity is formed by a plane reflector 2 and two identical plano-concave reflectors 3 and 4 . The reflectivity of the mirrors forming the initial optical cavity is greater than 99%. The initial optical cavity is a stable optical resonant cavity with a cavity length L 0 satisfy 00 (A 01 , A 00 is a constant coefficient, t is time) to fit the ring-down ...
PUM
Property | Measurement | Unit |
---|---|---|
reflectance | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com