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A small punch test device that can directly measure deflection

A testing device and small punch technology, applied in the field of reactor engineering, can solve problems such as uneven sample clamping force, and achieve the effect of direct sample deflection and direct in-situ measurement

Active Publication Date: 2019-03-29
CHINA INSTITUTE OF ATOMIC ENERGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this device can complete the test of material properties, when this SP device measures the deflection, there are stamping balls and punches between the beam of the testing machine for measuring data and the sample. The deflection of the sample causes inevitable systematic errors when the sample is pressurized, and the upper and lower clamping molds of the existing SP device are mainly connected by two bolts, which makes the clamping force on the sample uneven
Therefore, there is a large error in the deflection data measured by the existing technology

Method used

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  • A small punch test device that can directly measure deflection
  • A small punch test device that can directly measure deflection
  • A small punch test device that can directly measure deflection

Examples

Experimental program
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Effect test

Embodiment

[0031] In this embodiment, the upper clamping die 6, the lower clamping die 10 and the punch 11 are cylindrical. Before the test, the irradiated reactor pressure vessel steel was made into a thin disc-shaped small sample of φ3×0.3mm. Adjust the height of the punch 11 to a suitable position, tighten the first jacking wire located in the first jacking wire socket 8 to fix the punch 11, place the ball funnel 17 on the upper surface of the lower clamping die 10, and use the ball scoop 18 Take out the stamping ball 16 and put it into the ball funnel 17, the stamping ball 16 can fall into the center through hole of the lower clamping die 10 and be located at the upper end of the punch 11; then put the sample into the circular sample groove 15 of the lower clamping die 10 In the process, tighten the lower clamping die 10 and the upper clamping die 6, loosen the first jacking wire in the first jacking wire socket 8, make the punch 11 drop freely onto the rotating seat 12, and connect ...

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Abstract

The invention discloses a small punch testing device with an effect of directly measuring flexibility. The device mainly comprises a small punch testing device, a load tester and a temperature control system, wherein the small punch testing device comprises an upper support, a grating ruler, a displacement rod, an upper clamp die, a lower clamp die, a stamp ball, a punch and a base, wherein the upper support, the upper clamp die, the lower clamp die and the base are sequentially connected from top to bottom; the temperature control system comprises an environment furnace and a temperature controller, the environment furnace is arranged outside the upper and lower clamp dies on the small punch testing device and is connected with the temperature controller; the load tester is connected on the base of the small punch testing device. The small punch testing device is simple in structure, easy to operate and high in measured flexibility accuracy, and can be used for directly measuring the flexibility in situ.

Description

technical field [0001] The invention belongs to the technical field of reactor engineering, in particular to a small punch testing device which can directly measure deflection. Background technique [0002] The key components of the reactor (such as the reactor pressure vessel) are prone to radiation embrittlement during service, which will cause safety hazards to the operation of the reactor. Therefore, it is necessary to test and study the radiation embrittlement of the reactor pressure vessel material. When testing, often because the size of the standard sample is too large, it will cause a series of difficulties. [0003] The prior art small-punch test device (abbreviated as SP) is a method for testing the mechanical properties of small-sized samples, which is used in research fields such as nuclear engineering technology. Although this device can complete the test of material properties, when this SP device measures the deflection, there are stamping balls and punches ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N3/18G01M5/00G01B11/16G01B11/02
CPCG01B11/02G01B11/16G01M5/005G01N3/18
Inventor 佟振峰王成龙钟巍华宁广胜张长义杨文
Owner CHINA INSTITUTE OF ATOMIC ENERGY
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