Security-level DCS product automated testing device

Abstract

The invention provides an automated testing device for functions and performance of security-level DCS products. The device can perform automated testing on the following security-level DCS products: an analog input module AI, an analog output module AO, a digital input module DI, a digital output module DO, a point-to-point communication module, a controller module and a management module. The device mainly comprises a PXI chassis, desktop equipment and an assembly backboard. Software developed according to the invention runs in a PXI controller, the software adopts a modular system structure and comprises a human-computer interface and data display interface, an intermediate function layer assembly, data information storing and reading, a hardware equipment driving interface and equipment work log and security management. The security-level DCS product automated testing device solves problems of high operation and maintenance cost and poor expandability.

Description

technical field [0001] The invention belongs to the technical field of instrumentation analysis and measurement control, and in particular relates to an automatic test device for safety-level DCS products. Background technique [0002] The automated test system has been developed for many years. Although the research work on the automated test system is being carried out in many fields, and many of them have achieved good results, there are still some shortcomings in the automated test system: [0003] (1) The maintenance cost is high, which is not conducive to prolonging the life of the system and reducing the cost of use. Due to the rapid replacement of system hardware equipment, as the application time of the test system increases, many components face compatibility and maintenance difficulties, which further increases the maintenance cost of the system. [0004] (2) The specificity of the system, there is no expansion and self-adaptive ability. It can also be said that...

AI Technical Summary

Problems solved by technology

[0003] (1) The maintenance cost is high, which is not conducive to prolonging the life of the system and reducing the cost of use

Due to the rapid replacement of system hardware equipment, as the application time of the test system increases, many components face compatibility and maintenance difficulties, further increasing the maintenance cost of the system

[0004] (2) The specificity of the system, no expansion and self-adaptation capabilities

It can also be said that there is no universal test system in a complete sense, and many test systems are developed for specific applications.

Moreover, the systems are independent of each other, lacking openness and interoperability

[0005] (3) The test efficiency and failure report are not highly targeted

This will lead to the situation that the positioning accuracy is not high, and new faults and new cases cannot be solved

And one-sided reliance on the test platform cannot make full use of the experience of maintenance personnel, resulting in waste of manpower and material resources, not only cannot meet the testing needs of complex faults, but also the test efficiency is low

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