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An Interferometric Imaging Spectrometer with Active Focus

A technology of interference imaging and spectrometer, which is applied in the field of optics, can solve problems such as poor reliability and complex structure, and achieve the effects of improving reliability, high control precision, and good structural mechanical stability

Active Publication Date: 2018-11-02
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide an active focusing interference imaging spectrometer to solve the defects of complex structure and poor reliability in the prior art

Method used

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  • An Interferometric Imaging Spectrometer with Active Focus
  • An Interferometric Imaging Spectrometer with Active Focus
  • An Interferometric Imaging Spectrometer with Active Focus

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Embodiment Construction

[0018] The present invention will be described in detail below in conjunction with specific embodiments and accompanying drawings.

[0019] Such as figure 1 , 2 As shown in , 3, an interference imaging spectrometer that utilizes a temperature control system to realize active focusing, includes a pre-telescope assembly 8, a collimator assembly 9, an interferometer assembly 10, and a Fourier mirror assembly that are arranged in sequence along the optical path. 11 and focal plane assembly 12. Through the analysis of the optical system, the Fourier mirror component adopts an athermalized optical design scheme to ensure the stability of the interference surface in complex working environments; the front telephoto component adopts a long focal length, large relative aperture Cassegrain system; A temperature control system is added to the remote component, and the temperature control system is used to control the temperature. The purpose of fine-tuning the primary image plane 13 of...

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Abstract

The invention belongs to the optical field and especially relates to an active focusing interference imaging spectrometer. The spectrometer comprises a preposition telescopic assembly, a collimating mirror assembly, an interferometer assembly, a Fourier mirror assembly and a focal plane assembly. The preposition telescopic assembly is provided with a temperature control system. The temperature control system comprises a heating sheet arranged on an outer surface of a main lens cone of the preposition telescopic assembly and a thermistor. The heating sheet is connected to a power supply. The thermistor is connected to a temperature controller. Under the condition of guaranteeing interference imaging spectrometer loading performance, a moving component is not increased and system reliability improved. Control precision is high and a requirement of a high-resolution interference imaging spectrometer is satisfied. System mass is effectively mitigated and structural mechanics stability is good.

Description

technical field [0001] The invention belongs to the field of optics, in particular to an interference imaging spectrometer capable of active focus adjustment. Background technique [0002] In recent years, aerospace technology has developed very rapidly, and the application of spaceborne imaging spectrometers has become more and more extensive. Spectral imaging technology is a new imaging technology developed in the 1980s. It obtains material spectral information while obtaining image information, which can be used to classify and identify information. However, with the development of science and technology, the technical specifications of the imaging spectrometer are getting higher and higher. The imaging spectrometer has very strict requirements on the working environment, especially the working environment temperature. When the working environment temperature of the imaging spectrometer changes, it will bring great damage to the system. negative effect. In the space env...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/45G01J3/28
CPCG01J3/2823G01J3/45
Inventor 李思远张宏建李立英赵强孙剑
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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