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Terahertz time-domain spectrometer capable of variable-angle incidence and simultaneous measurement of transmission and reflection

A terahertz time-domain, spectrometer technology, applied in absorption/scintillation/reflection spectroscopy, optical radiometry, spectrometry/spectrophotometry/monochromator, etc. Inability to flexibly measure the spectrum of the sample, unable to meet the experimental needs, etc., to achieve the effects of flexible structure, improved extraction accuracy, and easy operation

Active Publication Date: 2017-02-22
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0003] The relative positions of the terahertz emitter, the detector and the sample holder in the existing terahertz time-domain spectrometer are fixed, so the existing terahertz time-domain spectrometer cannot flexibly measure the sample spectrum under different incident angles
In addition, the existing terahertz time-domain spectrometer generally adopts a transmission or reflection structure, and only one measurement mode can be selected at a time. The transmission spectrum and reflection spectrum cannot be obtained at the same time, and they need to be measured separately, which leads to complicated experimental operations. Data processing is also done separately
Therefore, the existing terahertz time-domain spectrometer cannot meet the experimental needs of simultaneously measuring the transmission and reflection spectra of samples at different angles of incidence

Method used

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  • Terahertz time-domain spectrometer capable of variable-angle incidence and simultaneous measurement of transmission and reflection
  • Terahertz time-domain spectrometer capable of variable-angle incidence and simultaneous measurement of transmission and reflection
  • Terahertz time-domain spectrometer capable of variable-angle incidence and simultaneous measurement of transmission and reflection

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Embodiment Construction

[0017] The present invention will be further described below in conjunction with the accompanying drawings. It should be noted that the described embodiments are only for facilitating the understanding of the present invention, and have no limiting effect on it.

[0018] Such as figure 1 , the present invention adopts the femtosecond laser as the excitation source, and the beam splitter (2) arranged at the output end of the femtosecond laser (1) divides a beam of laser light into two beams according to the ratio of 33% and 67%, wherein one beam of 33% It is used as probe light, and the other beam is divided into two beams according to the ratio of 50% and 50% by the beam splitter (3). One beam is also used as probe light, and the other is used as pump light; the pump light incident To the fiber coupler (4), through the optical fiber (22) to the terahertz emission module (5), the generated terahertz wave irradiates the sample on the sample holder (6); the terahertz wave transmi...

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Abstract

The invention discloses a terahertz time-domain spectrometer capable of variable-angle incidence and simultaneous measurement of transmission and reflection, and belongs to the technical field of spectrum. The spectrometer is characterized in that an output beam of a femtosecond laser is divided into two beams by a beam splitter, one beam is probe light, the other beam is divided into two beams through the beam splitter, one beam is pump light, the other beam is also probe light, the pump light is collected to a terahertz emitter to generate terahertz waves, the terahertz waves respectively reach two terahertz detectors through sample transmission and reflection, two channels of probe light are respectively collected to the two terahertz detectors, and transmission and reflection terahertz wave electric field amplitudes are calibrated; the terahertz emitter and the two terahertz detectors are both arranged on a circular rail with scales, and the positions of the terahertz emitter and the terahertz detectors are adjustable; and a sample frame is fixed at the position of the center of circle of the rail so that transmission and reflection spectrums of a sample in different angle incident conditions can be measured through adjustment of relative positions of the terahertz emitter and the terahertz detectors with the sample.

Description

technical field [0001] The invention relates to the field of spectroscopic technology, in particular to a terahertz time-domain spectrometer capable of simultaneously measuring transmission and reflection with variable angle incidence. Background technique [0002] The frequency range of terahertz electromagnetic waves is generally defined as 0.1 THz to 10 THz. Terahertz technology research is applied to many fields. Terahertz time-domain spectroscopy technology is an important technology for the practical application of terahertz science. This technology has a high detection signal-to-noise ratio and a wide detection bandwidth, and can be widely used in material property analysis, biomedical research, and security detection. It has a very practical application prospect. [0003] The relative positions of the terahertz emitter, the detector and the sample holder in the existing terahertz time-domain spectrometer are fixed, so the existing terahertz time-domain spectrometer...

Claims

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Application Information

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IPC IPC(8): G01J3/42G01J3/28
CPCG01J3/28G01J3/42G01J2003/425
Inventor 周俊涂珊胡少青
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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