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Method for testing electrical property of solar cell and components under short pulse width

A technology for electrical performance testing and solar cells, which is applied in the monitoring of electrical components, photovoltaic power generation, photovoltaic systems, etc., can solve problems such as inaccurate testing, and achieve the effect of eliminating capacitance effects, realizing testing, and accurate testing

Active Publication Date: 2017-02-15
陕西众森电能科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current mainstream technology cannot achieve accurate testing in the 10ms order of magnitude conventional mode

Method used

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  • Method for testing electrical property of solar cell and components under short pulse width
  • Method for testing electrical property of solar cell and components under short pulse width

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0025] A method for testing the electrical properties of solar cells and components with short pulse widths according to the present invention comprises the following testing steps:

[0026] (1) Determine the total test time T, the total test time T is the pulse width of the solar simulator test corresponding to the solar cell to be tested;

[0027] (2) According to the performance of the acquisition system and the total test time T, determine the number of sampling points n, where n is a natural number greater than 1; the number of sampling points is different in different acquisition systems.

[0028] (3) According to the solar battery electrical performance acquisition mode, determine that the total sampling interval voltage corresponds to the test range of the acquisition system output, and the voltage of each sampling point corresponds to the output value of the acquisition system, which is recorded as DA, where the maximum value of DA DAmax is the solar battery The theor...

Embodiment 2

[0035] In this embodiment, an N-type solar cell module is selected, a 12-bit acquisition system is used, and the Isc-Voc acquisition mode is used. The pulse width is 10ms, and the DAmax value is 2.5. The test steps are as follows:

[0036] (1) Determine the total test time T as 10ms;

[0037] (2) Since a 12-bit acquisition system is used, and the total test time T is 10ms, 95 sampling points are set;

[0038] (3) DAmax is 2.5, so the range of DA is 0-2.5;

[0039] (4) Divide the 95 sampling points in (1) into three sampling intervals, the sampling point numbers of the first sampling interval are 1 to 40, the sampling point numbers of the second sampling interval are 41 to 75; the sampling points of the third sampling interval The serial numbers are 76 to 95;

[0040] (5) According to the table in step (4) of Example 1, the test time of the first sampling interval is 0.1 ms, the test time of the second sampling interval is 0.7 ms, and the test time of the third sampling inter...

Embodiment 3

[0045] The present embodiment is the parallel test of embodiment 2, and its test result is as shown in the following table:

[0046] .

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Abstract

The invention relates to a method for testing an electrical property of a solar cell and components, in particular to a method for testing an electrical property of a solar cell and components under short pulse width. The method for testing the electrical property of the solar cell and the components under short pulse width comprises the following testing steps: (1) determining a total test time T, wherein the total test time T is a pulse width tested by a solar simulator corresponding to the solar cell to be tested; and (2), according to an acquisition system and the total test time T, determining the number n of sampling points, wherein n a natural number greater than 1. According to the method provided by the invention, under the relatively short pulse width, an accurate electrical performance parameter is acquired by a percentage of delay time t in divided sampling intervals to the total time of a total sampling interval of tested voltage and combining an electronic load driving technology. The method avoids test deviation caused by a capacitive effect, and can achieve accurate testing.

Description

[0001] The invention discloses a method for testing the short-pulse width electrical properties of solar cells and components. technical field [0002] The invention relates to a method for testing the electrical properties of solar cells and components, in particular to a method for testing the electrical properties of solar cells and components using short pulse widths. Background technique [0003] At present, the mainstream test technology for the electrical performance of conventional crystalline silicon solar cells mostly uses a pulse width of about 10ms to realize the test and collection of electrical performance. The load driving technology can realize accurate testing under the current pulse width condition of about 10ms. [0004] In recent years, with the advancement of technology and technology, more efficient battery research and development and industrialization have become a hot spot in the current market, while traditional solutions require longer pulse widths...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/10
CPCH02S50/10Y02E10/50
Inventor 冯云峰张会文王炜
Owner 陕西众森电能科技有限公司
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