Particulate matter concentration monitoring system on basis of mie scattering theories and method for applying particulate matter concentration monitoring system
A particle concentration and scattering theory technology, applied in the field of dust particle concentration measurement, can solve the problems of measurement accuracy, inability to realize online measurement, and inability to effectively distinguish particles of different particle sizes, so as to increase measurement accuracy, high reliability, and reduce intermediate link effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0020] In order to make the objects and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0021] Such as figure 1 As shown, the embodiment of the present invention provides a particle concentration monitoring system based on the mie scattering theory, including a transmitting end, a receiving end, a single-chip computer system and a 3G communication module, and the transmitting end is composed of a laser, a laser driver module, a first signal processing The circuit module is composed of four lasers with different wavelengths, all of which are equipped with PD output terminals to feedback the laser output laser intensity to correct the error caused by the change of the output light intensity; a beam expander is installed in front of t...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com