Method and device for detecting material uniformity of optical glass

A technology of optical glass and uniformity, which is applied in the direction of measuring devices, optical instrument testing, and testing optical properties, etc., can solve the problems of discontinuous splicing traces, increased test errors, and high costs, and achieve the goal of avoiding splicing traces and eliminating detection errors Effect

Active Publication Date: 2019-01-29
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the detection of the uniformity of large-aperture optical glass materials, it is too expensive to directly use large-aperture interferometers to solve the above problems. The existing technology cannot even manufacture interferometers and optical etalons that meet the requirements of caliber and test accuracy. Therefore, small-aperture based Interferometer combined with sub-aperture splicing technology to solve the problem of uniformity detection of large-aperture optical glass materials
However, the above solutions cannot test the defocus and astigmatism in the uniformity of materials with high precision, and because the tilt attitude of the inspected mirror is prone to change when the mirror is moved, the stitching process leaves discontinuous stitching in the final uniformity test results traces, resulting in increased uniformity test error

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for detecting material uniformity of optical glass
  • Method and device for detecting material uniformity of optical glass
  • Method and device for detecting material uniformity of optical glass

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0039] The terms "first", "second", "third" and "fourth" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily to describe a specific order or sequentially. It is to be understood that the terms so used are interchangeable under appropriate circums...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention proposes a method for detecting material uniformity of optical glass, which divides the inspected mirror into at least three sub-aperture areas, calculates the material uniformity of each sub-aperture area, and then uses the sub-aperture splicing algorithm to calculate the material of the inspected mirror In addition, the tilt attitude of the inspected mirror is monitored and corrected by the monitoring interferometer and the side plane mirror, so the tilt states of the uniformity test results of different sub-apertures are completely consistent, and the defocus and image in the uniformity The amount of "tilt" introduced in scattered sub-aperture interference detection results can be faithfully preserved, thereby avoiding discontinuous stitching traces in the full-aperture uniformity of the inspected mirror. The method proposed by the present invention can not only realize the absolute detection of all wave aberrations of material uniformity in the process of using a small-caliber phase-shifting interferometer to detect the uniformity of large-caliber optical glass materials, but also can eliminate discontinuous splicing traces. detection error.

Description

technical field [0001] The invention relates to the technical field of optical interference measurement, in particular to a method and device for detecting material uniformity of optical glass. Background technique [0002] High-precision optical imaging lenses are usually composed of multiple optical lenses. In order to achieve ideal imaging quality, the transmitted wavefront of the optical lens is required to reach the diffraction limit, and the material uniformity of the optical glass is one of the main sources of the transmission wavefront error of the optical lens. . In addition, when using the zero-position compensation mirror method to detect the aspheric mirror surface shape, in order to obtain high-precision aspheric surface shape detection results, it is necessary to correct various error sources of the zero-position compensation mirror, including the uniformity of the glass material of the compensation mirror. Effects of aspheric wavefronts. In the above applica...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/0271
Inventor 苗亮张文龙刘钰马冬梅金春水
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products