Piezoelectric material parameter test method and test apparatus based on dynamic method

Abstract

The invention relates to a piezoelectric material parameter test method and a test apparatus based on a dynamic method. A to-be-tested piezoelectric material is connected with a standard resistor in series, an impedance-frequency spectrum of the to-be-tested piezoelectric material is obtained through frequency sweep, a series connection resonant frequency fs and a parallel connection resonant frequency fp of the piezoelectric material can be calculated by change of corresponding impedance amplitudes, and the impedance value corresponding to the series connection resonant frequency is a dynamic resistance value Res of the to-be-tested piezoelectric material. A free capacitance value of the to-be-tested piezoelectric material is converted to a frequency value with a function relation by employing a 555 timer circuit, a corresponding static capacitance Cap is obtained through calculation, and the mechanical quality factor Qm can be calculated with the combination of the above four parameters.

Description

technical field [0001] The invention relates to a piezoelectric material parameter testing method and a testing device based on a dynamic method, belonging to the field of piezoelectric material parameter measurement. Background technique [0002] Piezoelectric materials play an important role in modern industry, and the continuous expansion of the application field of piezoelectric materials will inevitably require more accurate measurement of commonly used piezoelectric parameters. However, the parameters of piezoelectric materials are not only related to their composition, but also closely related to the manufacturing process. Various factors in the manufacturing process will cause its performance parameters to be affected. Therefore, the measurement of performance parameters of piezoelectric materials is of great significance. [0003] At present, piezoelectric material parameter testing devices often have a single test function and limited test parameters. For example...

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Problems solved by technology

[0003] At present, the piezoelectric material parameter testing devices often have a single test function and limited test parameters. For example, when measuring the resonance frequency of piezoelectric materials, the impedance parameter tester is basically used, and then other piezoelectric parameters are obtained through manual calculation.

Although the current impedance tester has reached the point where the test results are accurate and the technology is mature, the disadvantages of this method are that the test process is cumbersome, the degree of automation is low, the material test cycle is too long, and the efficiency is low.

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